The addition of Sb element improves the reliability of SAC305/Cu solder joints and inhibits the growth of IMC layer

IF 3.2 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Jikang Yan, Jian Zhao, Jiangshan Liu, Senlin Yi
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引用次数: 0

Abstract

Traditional SAC305 lead-free solder suffers from inferior wettability, excessive interfacial intermetallic compound (IMC) growth under high-temperature aging, and unsatisfactory mechanical performance and long-term reliability. To address these issues, trace Sb alloying modification was employed in this work, and SAC305-xSb composite solders (x = 1.5, 2.0, 2.5, 3.0 wt.%) were prepared. The influences of Sb doping content on the phase constitution, microstructural evolution, wettability, Vickers hardness, tensile strength and interfacial IMC growth kinetics of the solders were systematically explored. The results reveal that Sb can form solid solution in the β-Sn lattice and induce lattice distortion, whereas superfluous Sb precipitates as SnSb secondary phase. Moderate Sb addition evidently refines primary β-Sn grains, homogenizes the distribution of eutectic microstructure, and maintains the original interfacial IMC structure. The wettability, mechanical performance and IMC growth suppression capability are improved first and then deteriorated with increasing Sb content. Under isothermal aging at 150 ℃, IMC growth follows a diffusion-dominated parabolic law. The IMC growth coefficient k of SAC305-2.0Sb is only 0.05174, which is 34.6% lower than that of pristine SAC305, demonstrating a remarkable suppression effect on interfacial IMC proliferation. Considering wettability, interfacial thermal stability and mechanical performance comprehensively, 2.0 wt.% Sb exhibits the optimal comprehensive performance. Such an optimal doping level simultaneously optimizes wettability, strengthens mechanical properties and enhances interfacial stability, offering experimental support for the compositional design and practical engineering application of lead-free solders.

Sb元素的加入提高了SAC305/Cu焊点的可靠性,抑制了IMC层的生长
传统的SAC305无铅焊料在高温老化条件下存在润湿性差、界面金属间化合物(IMC)生长过多、力学性能和长期可靠性不理想等问题。为了解决这些问题,本工作采用微量Sb合金改性,制备了SAC305-xSb复合钎料(x = 1.5, 2.0, 2.5, 3.0 wt.%)。研究了Sb含量对钎料相组成、微观组织演变、润湿性、维氏硬度、抗拉强度和界面IMC生长动力学的影响。结果表明:Sb可以在β-Sn晶格中形成固溶体并引起晶格畸变,而多余的Sb则以SnSb次生相析出;适量添加Sb可明显细化初生β-Sn晶粒,均匀化共晶组织分布,保持原有界面IMC结构。随着Sb含量的增加,材料的润湿性、力学性能和抑制IMC生长能力先提高后降低。在150℃等温时效条件下,IMC的生长遵循以扩散为主的抛物线型规律。SAC305-2.0 sb的IMC生长系数k仅为0.05174,比原始SAC305降低了34.6%,对界面IMC增殖有显著抑制作用。综合考虑润湿性、界面热稳定性和力学性能,2.0 wt.% Sb具有最佳的综合性能。这种最佳掺杂水平同时优化了润湿性,增强了力学性能,增强了界面稳定性,为无铅焊料的成分设计和实际工程应用提供了实验支持。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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