Spectrograph for the Wavelength Range of 10–60 Å

Abstract

A diffraction spectrograph for the soft X-ray range with a grazing angle of 1.5°, which is compatible with modern CCD and CMOS detectors, has been developed and tested. Spectral decomposition is performed by a high-frequency spherical varied line-space grating, which produces a flat field in the wavelength range of 10‒60 Å. The spectrograph has been tested recording line spectra of multiply charged ions excited in laser plasmas of Teflon, aluminum, and titanium.