{"title":"40 years of measuring properties with atomic force microscopy.","authors":"Peter Grutter","doi":"10.1111/jmi.70168","DOIUrl":null,"url":null,"abstract":"<p><p>This paper gives a short personal retrospective of some of the AFM methods developed in the Grutter group. It gives an overview of methods developed with the aim of measuring properties with high spatial and temporal resolution. Frequency mode AFM has over the past 40 years developed into a spatially resolving technique allowing spectroscopy of quantum dots and traps in semiconductors with single charge sensitivity. Properties can also be measured on ultrafast time scales by using pump-probe techniques, resolving a 100 fs short optical pulse. Two major challenges are addressed in a brief outlook: reproducible tip fabrication and open-source automatisation to increase throughput and statistics.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":" ","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2026-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1111/jmi.70168","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
This paper gives a short personal retrospective of some of the AFM methods developed in the Grutter group. It gives an overview of methods developed with the aim of measuring properties with high spatial and temporal resolution. Frequency mode AFM has over the past 40 years developed into a spatially resolving technique allowing spectroscopy of quantum dots and traps in semiconductors with single charge sensitivity. Properties can also be measured on ultrafast time scales by using pump-probe techniques, resolving a 100 fs short optical pulse. Two major challenges are addressed in a brief outlook: reproducible tip fabrication and open-source automatisation to increase throughput and statistics.
期刊介绍:
The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit.
The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens.
Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.