A Versatile Approach to Measuring Complex GHz Permittivity of Substrate Supported Polymer Films

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
ACS Applied Electronic Materials Pub Date : 2026-09-22 Epub Date: 2026-09-09 DOI:10.1021/acsaelm.6c01375
Fahima Ouchen, Stefan B. Nikodemski, Emily Heckman, Mohammad I. Vakil, Jarrett H. Vella
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引用次数: 0

Abstract

Polymers have long been used as substrates and dielectric coatings for radiofrequency (RF) applications across a broad range of frequencies. No longer limited to polyolefins and other insulating backbone structures, a wide variety of conjugated, doped, and open-shell polymers and small molecules have been developed with tantalizing electrical properties waiting to be leveraged for low cost, size, weight, and power applications at GHz frequencies. A few isolated examples, such as polymer antennas, have been described, but the larger field of active, organic RF materials has been hindered by a lack of a simple, universally applicable measurement techniques. Values important to RF design, such as conductivity and mobility, are easily measured, but other critical measurements such as complex permittivity prevent rational design and modeling of active RF components made from organic conductors. Existing techniques measure bulk sample coupons inserted into waveguides or at low (kHz-MHz) frequencies, but a broadly applicable GHz solution has remained elusive. We present a broadband method for extracting the complex permittivity of polymeric films at GHz frequencies, employing the X-band (8–12 GHz) as a convenient frequency range. The material under test is deposited at the physical end of a coplanar waveguide where the radiating end effects are measured and analyzed. The complex permittivity is extracted from S11 measurements of the open-end coplanar waveguide by applying a combination of modified Nicolson-Ross-Weir algorithms and a multilayer conformal mapping method using specially derived theoretical relationships. Using this technique, the X-band permittivity of a representative polymer, SU-8, was obtained with >95% agreement to published literature values. The approach is suitable for any solution-processed organic material (polymers, macromolecules, small molecules) and provides a versatile, simple route to broadband RF characterization, key to unlocking the technological potential of these materials.

一种测量衬底支撑聚合物薄膜复GHz介电常数的通用方法
聚合物长期以来一直被用作广泛频率范围内射频(RF)应用的基材和介电涂层。不再局限于聚烯烃和其他绝缘骨架结构,各种各样的共轭、掺杂和开壳聚合物和小分子已经被开发出来,它们具有诱人的电性能,等待着在GHz频率下实现低成本、小尺寸、轻重量和功率应用。已经描述了一些孤立的例子,例如聚合物天线,但是由于缺乏简单,普遍适用的测量技术,有源有机射频材料的更大领域受到阻碍。对射频设计很重要的值,如电导率和迁移率,很容易测量,但其他关键的测量,如复介电常数,阻碍了由有机导体制成的有源射频元件的合理设计和建模。现有的技术测量插入波导或低(kHz-MHz)频率的大量样品,但广泛适用的GHz解决方案仍然难以捉摸。我们提出了一种在GHz频率下提取聚合物薄膜复介电常数的宽带方法,采用x波段(8-12 GHz)作为方便的频率范围。被测材料沉积在共面波导的物理端,在那里测量和分析辐射端效应。采用改进的Nicolson-Ross-Weir算法和基于特殊推导的理论关系的多层保角映射方法,从开放式共面波导的S11测量数据中提取复介电常数。利用该技术,获得了具有代表性的聚合物SU-8的x波段介电常数,与已发表的文献值的一致性为95%。该方法适用于任何溶液处理的有机材料(聚合物、大分子、小分子),并为宽带射频表征提供了一种通用、简单的途径,这是释放这些材料技术潜力的关键。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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