Spectral Characterization and Performance of SPT-SLIM On-Chip Filterbank Spectrometers

IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
C. S. Benson;K. Fichman;M. Adamic;A. J. Anderson;P. S. Barry;B. A. Benson;E. Brooks;J. E. Carlstrom;T. Cecil;C. L. Chang;K. R. Dibert;M. Dobbs;K. S. Karkare;G. K. Keating;A. M. Lapuente;M. Lisovenko;D. P. Marrone;J. Montgomery;T. Natoli;Z. Pan;A. Rahlin;G. Robson;M. Rouble;G. Smecher;V. Yefremenko;M. R. Young;C. Yu;J. A. Zebrowski;C. Zhang
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引用次数: 0

Abstract

The south pole telescope Shirokoff line intensity mapper (SPT-SLIM) experiment is a pathfinder for demonstrating the use of on-chip spectrometers for millimeter (mm) line intensity mapping. We present spectral bandpass measurements of the SPT-SLIM spectrometer channels made on site using a Fourier transform spectrometer (FTS) during the first deployment of SPT-SLIM in the 2024–2025 austral summer season. We note the effect of FTS systematics on measurements of on-chip filterbank spectrometer resolutions and demonstrate a technique for measuring the narrow band passes of the SPT-SLIM filterbanks that improves beyond the intrinsic resolution of an FTS.
SPT-SLIM片上滤波组光谱仪的光谱表征与性能
南极望远镜Shirokoff线强度映射(SPT-SLIM)实验是演示使用片上光谱仪进行毫米(mm)线强度映射的探路者。我们介绍了在2024-2025年南方夏季首次部署SPT-SLIM期间,使用傅里叶变换光谱仪(FTS)现场对SPT-SLIM光谱仪通道进行的光谱带通测量。我们注意到FTS系统对片上滤波器组光谱仪分辨率测量的影响,并演示了一种用于测量SPT-SLIM滤波器组窄带通的技术,该技术提高了FTS的固有分辨率。
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来源期刊
IEEE Transactions on Applied Superconductivity
IEEE Transactions on Applied Superconductivity 工程技术-工程:电子与电气
CiteScore
3.50
自引率
33.30%
发文量
650
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Applied Superconductivity (TAS) contains articles on the applications of superconductivity and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Large scale applications include magnets for power applications such as motors and generators, for magnetic resonance, for accelerators, and cable applications such as power transmission.
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