Mahmoud Ibrahim, Heba A. Esawii, Zh. V. Mezentseva, Aleksandr Sergiyovich Doroshkevich, A. H. A. Elmekawy
{"title":"Nano Diode-Type Protonic Transport in Hydrated 3 Mol.% Yttria-Stabilized Zirconia (3YSZ) Nanopowders: Humidity Dependence and Isotope Effect (H2O/D2O)","authors":"Mahmoud Ibrahim, Heba A. Esawii, Zh. V. Mezentseva, Aleksandr Sergiyovich Doroshkevich, A. H. A. Elmekawy","doi":"10.1007/s11664-026-13063-x","DOIUrl":null,"url":null,"abstract":"<div><p>In this study, we report the formation of a chemically symmetric nanoscale rectifying junction at the interface between yttria-stabilized zirconia (YSZ, ZrO<sub>2</sub>–3 mol.% Y<sub>2</sub>O<sub>3</sub>) nanoparticles of identical composition but different crystallite sizes. Nanopowders were synthesized via co-precipitation and thermally treated at 400°C, 500°C, and 700°C, yielding crystallite sizes ranging from approximately 7.5 nm to 14 nm, while preserving the cubic fluorite structure and chemical homogeneity. Rectifying contacts were fabricated in three configurations: 400–400, 400–500, and 400–700.Comprehensive structural characterization was carried out using transmission electron microscopy (TEM), x-ray diffraction (XRD), and small-angle x-ray scattering (SAXS). SAXS analysis provided quantitative information on nanoscale domain size, surface roughness, and interparticle correlations, which are critical for understanding interfacial charge transport behavior.Electrical characterization was performed using current–voltage measurements under controlled relative humidity levels (65%, 75%, and 85%) in both H<sub>2</sub>O- and D<sub>2</sub>O-enriched atmospheres. Junctions formed between nanoparticles with different crystallite sizes (400–500 and 400–700) exhibited pronounced rectifying behavior that intensified with increasing humidity, whereas the symmetric 400–400 junction displayed an approximately ohmic response. Replacement of H<sub>2</sub>O with D<sub>2</sub>O led to a systematic decrease in current, confirming the dominant contribution of proton-mediated transport within the hydrated interfacial region. Our findings demonstrate that nanoscale size disparity alone, without compositional gradients, can induce diode-like behavior in homogeneous oxide systems. The results highlight the critical role of hydration-assisted interfacial proton conduction and offer a novel strategy for engineering nanoionic rectifiers and environmentally responsive oxide-based electronic devices.</p></div>","PeriodicalId":626,"journal":{"name":"Journal of Electronic Materials","volume":"55 10","pages":"8891 - 8909"},"PeriodicalIF":2.8000,"publicationDate":"2026-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s11664-026-13063-x","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, we report the formation of a chemically symmetric nanoscale rectifying junction at the interface between yttria-stabilized zirconia (YSZ, ZrO2–3 mol.% Y2O3) nanoparticles of identical composition but different crystallite sizes. Nanopowders were synthesized via co-precipitation and thermally treated at 400°C, 500°C, and 700°C, yielding crystallite sizes ranging from approximately 7.5 nm to 14 nm, while preserving the cubic fluorite structure and chemical homogeneity. Rectifying contacts were fabricated in three configurations: 400–400, 400–500, and 400–700.Comprehensive structural characterization was carried out using transmission electron microscopy (TEM), x-ray diffraction (XRD), and small-angle x-ray scattering (SAXS). SAXS analysis provided quantitative information on nanoscale domain size, surface roughness, and interparticle correlations, which are critical for understanding interfacial charge transport behavior.Electrical characterization was performed using current–voltage measurements under controlled relative humidity levels (65%, 75%, and 85%) in both H2O- and D2O-enriched atmospheres. Junctions formed between nanoparticles with different crystallite sizes (400–500 and 400–700) exhibited pronounced rectifying behavior that intensified with increasing humidity, whereas the symmetric 400–400 junction displayed an approximately ohmic response. Replacement of H2O with D2O led to a systematic decrease in current, confirming the dominant contribution of proton-mediated transport within the hydrated interfacial region. Our findings demonstrate that nanoscale size disparity alone, without compositional gradients, can induce diode-like behavior in homogeneous oxide systems. The results highlight the critical role of hydration-assisted interfacial proton conduction and offer a novel strategy for engineering nanoionic rectifiers and environmentally responsive oxide-based electronic devices.
期刊介绍:
The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications.
Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field.
A journal of The Minerals, Metals & Materials Society.