Mnakri Minyar, Saber Nasri, Nazir Mustapha, Mokhtar Hjiri, Malika Ben Gzaiel, Abderrazek Oueslati
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引用次数: 0
Abstract
Fe2SnO4 inverse spinel ceramics were synthesized via a conventional solid-state reaction to establish a quantitative structure–property correlation spanning crystallography, optical response, and charge transport dynamics. X-ray diffraction with Rietveld refinement confirmed a single-phase inverse spinel structure with high crystallinity. Scanning electron microscopy revealed interconnected nanoparticles with an average diameter of ~ 41.9 nm. Ultraviolet–visible (UV–Vis) diffuse reflectance spectroscopy yielded a direct bandgap of 4.0 ± 0.12 eV and Urbach energy of 0.55 eV, indicating limited structural disorder and suitability for UV-range optoelectronic applications. Broadband impedance spectroscopy (1–106 Hz, 413–553 K) demonstrated negative temperature coefficient of resistance (NTCR) behavior and non-Debye relaxation, with equivalent circuit modeling effectively separating grain and grain-boundary contributions. Alternating current (AC) conductivity analysis identified a frequency-dependent crossover between two polaronic transport regimes: correlated barrier hopping (CBH) at high frequencies and non-overlapping small-polaron tunneling (NSPT) at intermediate frequencies. Direct current (DC) conductivity followed an Arrhenius dependence with an activation energy of 0.91 eV, confirming thermally activated small-polaron hopping between Fe2+ and Fe3+ octahedral sites. These results establish a coherent framework linking lattice disorder to charge carrier dynamics in Fe2SnO4, highlighting its potential for NTC thermistors, UV photodetectors, and resistive gas sensors where predictable, defect-mediated conduction is essential.
期刊介绍:
The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications.
Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field.
A journal of The Minerals, Metals & Materials Society.