Enhanced Thermoelectric Performance of In2O3 via Potassium Doping: Decoupling Electrical and Thermal Transport

IF 2.8 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Bo Feng, Zhiwen Yang, Yonghong Chen, Haibo Lian, Wenzheng Li, Tong Tang, Guopeng Zhou, Suoluosu Yang, Tongqiang Xiong, Haitao Zhang, Wenhua Dai, Jiang Zhu, Sihan Cheng
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Abstract

To tackle the low thermoelectric figure-of-merit (ZT) of In2O3-based n-type oxide thermoelectrics arising from high thermal conductivity, we perform a systematic investigation on K-doped In2O3. Doping with large-radius K+ achieves coordinated regulation of electrical and thermal transport behaviors. Characterizations confirm that low-concentration K is fully soluble in the In2O3 lattice and triggers lattice expansion and distortion. After K incorporation, the carrier concentration increases from ~ 8.6 × 1017 cm−3 to ~ 1.33 × 1019 cm−3, along with enhanced electrical conductivity. The elevated density of states around the Fermi level restrains the reduction of the Seebeck coefficient and optimizes the power factor. The introduced mass and stress fluctuations lower the Young’s modulus and strengthen phonon scattering, leading to reduced lattice thermal conductivity. By separately optimizing electrical conduction and thermal conduction, the ZT value and high-temperature thermoelectric performance of the samples are improved. This work provides a practical doping route for the preparation of high-performance, low-cost and environmentally friendly n-type oxide thermoelectric materials.

钾掺杂增强In2O3的热电性能:电与热输运解耦
为了解决由高导热性引起的基于In2O3的n型氧化物热电材料的低热电性能(ZT),我们对k掺杂In2O3进行了系统的研究。大半径K+的掺杂实现了电输运和热输运行为的协调调节。表征证实,低浓度K完全溶解于In2O3晶格中,并引发晶格膨胀和畸变。掺入K后,载流子浓度从~ 8.6 × 1017 cm−3增加到~ 1.33 × 1019 cm−3,电导率提高。费米能级附近态密度的提高抑制了塞贝克系数的减小,优化了功率因数。引入的质量和应力波动降低了杨氏模量,增强了声子散射,导致晶格导热系数降低。通过分别优化导电和热传导,提高了样品的ZT值和高温热电性能。本工作为制备高性能、低成本、环保的n型氧化物热电材料提供了一条实用的掺杂途径。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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