A. V. Ilyinsky, R. A. Castro, A. A. Kononov, I. O. Timofeeva, E. B. Shadrin
{"title":"Polarization Processes in Silver Iodide Films Doped with Copper","authors":"A. V. Ilyinsky, R. A. Castro, A. A. Kononov, I. O. Timofeeva, E. B. Shadrin","doi":"10.1134/S1027451026700849","DOIUrl":null,"url":null,"abstract":"<p>Using dielectric spectroscopy (DS), this study investigated the characteristics of polarization processes in copper-doped nanocrystalline silver iodide films in the region of the thermal superionic phase transition. It was found that doping with copper (5 vol %) leads to a decrease in the resonance frequency of the DS features, accompanied by an increase in the amplitude of the features in the frequency dependences of the imaginary (ε\") and real (ε') components of the complex dielectric permittivity. A power-law frequency dependence of the electrical conductivity σ was observed, and the exponent s of this dependence was shown to undergo an abrupt change at the superionic phase transition temperature <i>T</i><sub>c</sub> = 433 K. The temperature dependence of the exponent <i>s</i>(<i>T</i>) was found to correspond to two charge-transport mechanisms governing electrical conductivity: thermally activated hopping conduction at <i>T</i> < <i>T</i><sub>c</sub> and quantum-mechanical tunneling at <i>T</i> > <i>T</i><sub>c</sub>. The relaxation and energy parameters of charge-transport processes in the AgI:Cu film system were calculated, making it possible to determine a non-Debye mechanism of dielectric relaxation in the AgI:Cu system.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"20 2","pages":"409 - 416"},"PeriodicalIF":0.4000,"publicationDate":"2026-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451026700849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Using dielectric spectroscopy (DS), this study investigated the characteristics of polarization processes in copper-doped nanocrystalline silver iodide films in the region of the thermal superionic phase transition. It was found that doping with copper (5 vol %) leads to a decrease in the resonance frequency of the DS features, accompanied by an increase in the amplitude of the features in the frequency dependences of the imaginary (ε") and real (ε') components of the complex dielectric permittivity. A power-law frequency dependence of the electrical conductivity σ was observed, and the exponent s of this dependence was shown to undergo an abrupt change at the superionic phase transition temperature Tc = 433 K. The temperature dependence of the exponent s(T) was found to correspond to two charge-transport mechanisms governing electrical conductivity: thermally activated hopping conduction at T < Tc and quantum-mechanical tunneling at T > Tc. The relaxation and energy parameters of charge-transport processes in the AgI:Cu film system were calculated, making it possible to determine a non-Debye mechanism of dielectric relaxation in the AgI:Cu system.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.