Polarization Processes in Silver Iodide Films Doped with Copper

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
A. V. Ilyinsky, R. A. Castro, A. A. Kononov, I. O. Timofeeva, E. B. Shadrin
{"title":"Polarization Processes in Silver Iodide Films Doped with Copper","authors":"A. V. Ilyinsky,&nbsp;R. A. Castro,&nbsp;A. A. Kononov,&nbsp;I. O. Timofeeva,&nbsp;E. B. Shadrin","doi":"10.1134/S1027451026700849","DOIUrl":null,"url":null,"abstract":"<p>Using dielectric spectroscopy (DS), this study investigated the characteristics of polarization processes in copper-doped nanocrystalline silver iodide films in the region of the thermal superionic phase transition. It was found that doping with copper (5 vol %) leads to a decrease in the resonance frequency of the DS features, accompanied by an increase in the amplitude of the features in the frequency dependences of the imaginary (ε\") and real (ε') components of the complex dielectric permittivity. A power-law frequency dependence of the electrical conductivity σ was observed, and the exponent s of this dependence was shown to undergo an abrupt change at the superionic phase transition temperature <i>T</i><sub>c</sub> = 433 K. The temperature dependence of the exponent <i>s</i>(<i>T</i>) was found to correspond to two charge-transport mechanisms governing electrical conductivity: thermally activated hopping conduction at <i>T</i> &lt; <i>T</i><sub>c</sub> and quantum-mechanical tunneling at <i>T</i> &gt; <i>T</i><sub>c</sub>. The relaxation and energy parameters of charge-transport processes in the AgI:Cu film system were calculated, making it possible to determine a non-Debye mechanism of dielectric relaxation in the AgI:Cu system.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"20 2","pages":"409 - 416"},"PeriodicalIF":0.4000,"publicationDate":"2026-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451026700849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0

Abstract

Using dielectric spectroscopy (DS), this study investigated the characteristics of polarization processes in copper-doped nanocrystalline silver iodide films in the region of the thermal superionic phase transition. It was found that doping with copper (5 vol %) leads to a decrease in the resonance frequency of the DS features, accompanied by an increase in the amplitude of the features in the frequency dependences of the imaginary (ε") and real (ε') components of the complex dielectric permittivity. A power-law frequency dependence of the electrical conductivity σ was observed, and the exponent s of this dependence was shown to undergo an abrupt change at the superionic phase transition temperature Tc = 433 K. The temperature dependence of the exponent s(T) was found to correspond to two charge-transport mechanisms governing electrical conductivity: thermally activated hopping conduction at T < Tc and quantum-mechanical tunneling at T > Tc. The relaxation and energy parameters of charge-transport processes in the AgI:Cu film system were calculated, making it possible to determine a non-Debye mechanism of dielectric relaxation in the AgI:Cu system.

掺杂铜的碘化银薄膜的极化过程
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书