V. P. Popov, S. N. Podlesny, V. A. Antonov, Yu. A. Zhivodkov, I. N. Kupriyanov, Yu. N. Palyanov
{"title":"Generation of NV– Centers in Diamond Nanostructures: PL, ODMR, and Spin Coherence","authors":"V. P. Popov, S. N. Podlesny, V. A. Antonov, Yu. A. Zhivodkov, I. N. Kupriyanov, Yu. N. Palyanov","doi":"10.1134/S1027451026700795","DOIUrl":null,"url":null,"abstract":"<p>The nanolayers and nanomembranes with the 30–300 thickness and the 0.5 ppm NV<sup>–</sup> center content were produced by 50 keV <span>\\({\\text{H}}_{2}^{ + }\\)</span> ion implantation in Ib type (111) diamond plates and vacuum or high pressure annealing with subsequent lift-off process. The similar NV<sup><b>–</b></sup> content nanolayers were formed by N<sup>+</sup> ion implantation in IIa type (111) diamond plates and similar annealings. 〈111〉 oriented nanopillars were produced on both types of nanolayers using focused ion beam (FIB) with Ga<sup>+</sup> 30 keV maskless milling. The unusual optically detected magnetic resonances (ODMRs) were measured in a single nanopillars with a height of 500‒700 nm and of 250 nm in diameter covered by an amorphous a-C:Ga nanolayer in the 0‒20 G magnetic field. They demonstrated both a significant decrease in the gyromagnetic ratio and the quenching of photoluminescence (PL) signal from the NV<sup>–</sup> centers inclined to the nanopillar axis by the conductive a‑C:Ga nanolayer and stresses created by it. The multistep O<sub>2</sub> RIE plasma etching restored the normal ODMR resonance frequencies and intensities for all four NV<sup>–</sup>center orientations in (111) diamond nanopillars.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"20 2","pages":"356 - 361"},"PeriodicalIF":0.4000,"publicationDate":"2026-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451026700795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The nanolayers and nanomembranes with the 30–300 thickness and the 0.5 ppm NV– center content were produced by 50 keV \({\text{H}}_{2}^{ + }\) ion implantation in Ib type (111) diamond plates and vacuum or high pressure annealing with subsequent lift-off process. The similar NV– content nanolayers were formed by N+ ion implantation in IIa type (111) diamond plates and similar annealings. 〈111〉 oriented nanopillars were produced on both types of nanolayers using focused ion beam (FIB) with Ga+ 30 keV maskless milling. The unusual optically detected magnetic resonances (ODMRs) were measured in a single nanopillars with a height of 500‒700 nm and of 250 nm in diameter covered by an amorphous a-C:Ga nanolayer in the 0‒20 G magnetic field. They demonstrated both a significant decrease in the gyromagnetic ratio and the quenching of photoluminescence (PL) signal from the NV– centers inclined to the nanopillar axis by the conductive a‑C:Ga nanolayer and stresses created by it. The multistep O2 RIE plasma etching restored the normal ODMR resonance frequencies and intensities for all four NV–center orientations in (111) diamond nanopillars.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.