Three-Dimensional Model of Diffusion of Nonequilibrium Minority Charge Carriers Generated by an Electron Probe in a Homogeneous Semiconductor Target in the Presence of Two Recombination Channels

IF 0.4 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2026-08-16 DOI:10.1134/S1027451026700916

E. V. Seregina, M. A. Stepovich, M. N. Filippov, V. V. Kalmanovich

引用次数: 0

Abstract

The process of nonstationary diffusion of nonequilibrium minority charge carriers occurring after the termination of electron-beam irradiation of a semiconductor target is considered. Mathematical models of three-dimensional diffusion of charge carriers generated by an electron beam with energies up to 50 keV in a homogeneous semiconductor material were investigated for the cases of one or two independent recombination channels. Model calculations were performed for the diffusion of excitons in homogeneous single-crystal gallium nitride.

查看原文本刊更多论文

两个复合通道存在时，电子探针产生的非平衡少数载流子在均匀半导体靶中的三维扩散模型

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.