T. L. Murashkina, S. P. Korneev, A. E. Zhdanov, K. D. Kamelina
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引用次数: 0
Abstract
This study reports the synthesis and structural characterization of two equimolar high-entropy alloys, TiVCrNbCo and TiVCrNbZr, which are promising hydrogen storage materials. The alloys were produced via vacuum arc melting of elemental powders under an argon atmosphere; then their phase composition and microstructure were characterized using X-ray diffraction (XRD) and scanning electron microscopy with energy-dispersive spectroscopy (SEM–EDS), both before and after hydrogen decrepitation (HD process). The TiVCrNbCo alloy predominantly crystallizes in the hexagonal Laves C14 phase, whereas the TiVCrNbZr alloy forms a structure consisting whereas the TiVCrNbZr alloy forms a structure consisting of mixtures of cubic Laves C15 and body-centered cubic (BCC) phases. Hydrogen process transforms both alloys into finely dispersed powders, leaving residual hydrogen contents of 0.19 wt % for TiVCrNbCo and 1.8 wt % for TiVCrNbZr. Phase analysis after HD process shows that TiVCrNbCo retains the hexagonal C14 phase along with a secondary C14 + H phase, which likely corresponds to a solid solution of hydrogen. In contrast, the HD-crushed TiVCrNbZr powder contains the cubic Laves C15 phase and an face-centered cubic (FCC), phase, indicating a BCC-to-FCC transformation characteristic of hydrogenation-induced structural changes. In situ XRD measurements reveal no significant structural rearrangement upon heating of the HD-crushed samples; however, clear changes in reflection intensities are observed due to thermal lattice expansion and progressive hydrogen desorption. Hydrogen release occurs at approximately 200°C for TiVCrNbCo and 500°C for TiVCrNbZr.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.