Final Response to Authors of “Experimental Evaluation of Relationship Between Radiofrequency Heating Near Implanted Conductive Devices, Scanner-Reported B1+rms, and Transmit Power”

IF 4.5 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
IEEE journal of microwaves Pub Date : 2026-03-01 Epub Date: 2026-03-17 DOI:10.1109/JMW.2026.3666607
Michael Steckner;Mark Conroy;Jonathan Edmonson;Tolga Goren
{"title":"Final Response to Authors of “Experimental Evaluation of Relationship Between Radiofrequency Heating Near Implanted Conductive Devices, Scanner-Reported B1+rms, and Transmit Power”","authors":"Michael Steckner;Mark Conroy;Jonathan Edmonson;Tolga Goren","doi":"10.1109/JMW.2026.3666607","DOIUrl":null,"url":null,"abstract":"We1Response to Authors’ Reply to Comments received Oct. 8, 2025. Complete correspondence appears in the March 2026 issue. thank the authors [1] for their response. This final reply focuses on three key sentences: 1)The following incorrect statement: “there are no user-controlled RF shimming instructions in the implant safety labeling.” 2)The consequences of not controlling, nor documenting, experimental parameters with variable impact on the results: “The scanner was allowed to make all of the RF adjustments automatically to avoid user induced variation.” 3)Stratifying the diverse experiments demonstrates equal temperature spread in a power vs B1+rms comparison: “We encourage the authors to view Fig. 4 and observe the vertical variation of RF power with RF coils for a given B1+rms.”","PeriodicalId":93296,"journal":{"name":"IEEE journal of microwaves","volume":"6 2","pages":"493-494"},"PeriodicalIF":4.5000,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11437555","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE journal of microwaves","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11437555/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/3/17 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

We1Response to Authors’ Reply to Comments received Oct. 8, 2025. Complete correspondence appears in the March 2026 issue. thank the authors [1] for their response. This final reply focuses on three key sentences: 1)The following incorrect statement: “there are no user-controlled RF shimming instructions in the implant safety labeling.” 2)The consequences of not controlling, nor documenting, experimental parameters with variable impact on the results: “The scanner was allowed to make all of the RF adjustments automatically to avoid user induced variation.” 3)Stratifying the diverse experiments demonstrates equal temperature spread in a power vs B1+rms comparison: “We encourage the authors to view Fig. 4 and observe the vertical variation of RF power with RF coils for a given B1+rms.”
对“植入导电装置附近射频加热、扫描仪报告B1+rms和发射功率关系的实验评估”作者的最终答复
我们对作者对2025年10月8日收到的评论的回复的回应。完整的通信出现在2026年3月的问题。感谢作者[1]的回复。最后的回复集中在三个关键句子上:1)以下错误陈述:“植入物安全标签中没有用户控制的射频闪烁说明。”2)不控制或不记录对结果有可变影响的实验参数的后果:“扫描仪允许自动进行所有RF调整,以避免用户引起的变化。”3)对不同实验进行分层,表明功率与B1+rms比较时温度分布相等:“我们鼓励作者查看图4,观察给定B1+rms下RF线圈的RF功率的垂直变化。”
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来源期刊
CiteScore
10.70
自引率
0.00%
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审稿时长
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