{"title":"NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization","authors":"Tao Zou;Zhenxing Dou;Zhiwei Chen;Yijiao Wang;Wen Shi;Zhiyu Wang;Peng Wang;Runsheng Wang;Weisheng Zhao;Asen Asenov","doi":"10.1109/TCAD.2025.3604349","DOIUrl":null,"url":null,"abstract":"As transistor sizes continue shrinking, the impacts of variability have become ever more paramount in circuit design and manufacturing. Their accurate representations in model cards help save design margins and provide appropriate guidelines in design technology co-optimization (DTCO). To address such a challenge, we propose a novel machine learning framework, normalizing flow-based joint generative (NFGen) model, which generates a comprehensive model library from a limited number of model cards. Unlike traditional generative methods that focus on the marginal distribution of model card parameters, NFGen is the first model to approximate their joint distribution, which includes information on their correlation and thus enables closer representation of variability effects. In addition, we introduce two similarity metrics to rigorously evaluate the quality of generated model cards. Experimental results show that NFGen reduces overall error by <inline-formula> <tex-math>$2\\times $ </tex-math></inline-formula> to <inline-formula> <tex-math>$8\\times $ </tex-math></inline-formula> compared to state-of-the-art methods, validating its superiority in variability-aware DTCO.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"45 4","pages":"1764-1768"},"PeriodicalIF":3.6000,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11145147/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/8/29 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
As transistor sizes continue shrinking, the impacts of variability have become ever more paramount in circuit design and manufacturing. Their accurate representations in model cards help save design margins and provide appropriate guidelines in design technology co-optimization (DTCO). To address such a challenge, we propose a novel machine learning framework, normalizing flow-based joint generative (NFGen) model, which generates a comprehensive model library from a limited number of model cards. Unlike traditional generative methods that focus on the marginal distribution of model card parameters, NFGen is the first model to approximate their joint distribution, which includes information on their correlation and thus enables closer representation of variability effects. In addition, we introduce two similarity metrics to rigorously evaluate the quality of generated model cards. Experimental results show that NFGen reduces overall error by $2\times $ to $8\times $ compared to state-of-the-art methods, validating its superiority in variability-aware DTCO.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.