Approximate Logic Synthesis for Dot-Inverter Graphs Using Node Merging-Enhanced Genetic Algorithm-Based Approach

IF 3.6 3区 计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yi-Ting Li;Ihao Chen;Yung-Chih Chen;Chun-Yao Wang
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引用次数: 0

Abstract

This article presents a novel approach to approximate logic synthesis (ALS) targeting at Dot-Inverter Graph (DIG), which is known for its superior expressive ability among all three-input gates and its potential in the future technology. We focus on minimizing the size of DIG circuits while maintaining acceptable error rates (ERs) by introducing a node merging (NM)-enhanced genetic algorithm (GA)-based approach. The NM technique reduces the DIG size without altering its functionality, while the GA, incorporating average relative Hamming distance (ARHD) and a self-adjusted mutation level (ML), is used for ALS on DIGs. Our experimental results demonstrated that the proposed approach achieves a higher reduction rate and less CPU time on different sizes of circuits compared to the state-of-the-art ALS approach.
基于节点合并增强遗传算法的点逆变图近似逻辑综合
本文提出了一种针对点逆变器图(DIG)的近似逻辑合成(ALS)的新方法,该方法以其在所有三输入门之间的优越表达能力和未来技术的潜力而闻名。通过引入一种基于节点合并(NM)增强的遗传算法(GA)的方法,我们专注于最小化DIG电路的尺寸,同时保持可接受的错误率(ERs)。NM技术在不改变其功能的情况下减小了DIG的大小,而GA技术结合了平均相对汉明距离(ARHD)和自我调节突变水平(ML),用于DIG上的ALS。我们的实验结果表明,与最先进的ALS方法相比,该方法在不同尺寸的电路上实现了更高的还原率和更少的CPU时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
5.60
自引率
13.80%
发文量
500
审稿时长
7 months
期刊介绍: The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.
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