Long-Term Evaluation of Joint Resistivity in Lap Joints of REBCO Tapes With Indium Depending on Pre-Joint Process and Storage Temperature

IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Reo Tamura;Satoshi Ito;Ryoichiro Hayasaka;Nagato Yanagi;Hidetoshi Hashizume
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引用次数: 0

Abstract

Bridge-type mechanical lap joints with indium foil insertion have been developed for joint winding of high-temperature superconducting (HTS) helical coils in heliotron-type stellarator fusion reactors. While joints between copper-stabilized Rare-earth Barium Copper Oxide (REBCO) tapes have demonstrated consistently low resistance, their long-term stability remains insufficiently understood. In this study, we first quantified volumetric resistivity of CuIn2 formed at the Cu/In interface using a mechanical lap joint of copper-stabilized REBCO tapes with indium insertion based on four-terminal resistance measurement and cross-sectional Scanning Electron Microscope and Energy Dispersive X-ray Spectroscopy (SEM-EDX) analysis. Subsequently, we evaluated the time-dependent evolution of joint resistivity under different pre-treatment conditions (with or without ethanol cleaning) and storage temperatures (300 K or 77 K). Based on these results, a model was developed to separate diffusion-driven and non-diffusional contributions to joint resistivity. The results revealed that storage at 300 K leads to a monotonic increase in joint resistivity, primarily due to CuIn2 growth, while storage at 77 K suppresses such changes. Additionally, in samples not treated with ethanol cleaning, a significant increase in resistivity occurring with a delay at 300 K was observed, consistent with corrosion-related mechanisms.
含铟REBCO带搭接接头中接头电阻率随预接工艺和储存温度的长期评价
介绍了一种用于高温超导(HTS)螺旋线圈在仿星器核聚变反应堆中的接合绕组的桥式机械搭接。虽然铜稳定的稀土钡氧化铜(REBCO)带之间的接头一直表现出低电阻,但其长期稳定性仍未得到充分的了解。在这项研究中,我们首先基于四端电阻测量和横断面扫描电子显微镜和能量色散x射线能谱(SEM-EDX)分析,利用插入铟的铜稳定REBCO带的机械搭接,量化了Cu/In界面形成的CuIn2的体积电阻率。随后,我们评估了不同预处理条件(有或没有乙醇清洗)和储存温度(300 K或77 K)下联合电阻率的随时间演变。基于这些结果,建立了一个模型来分离扩散驱动和非扩散对联合电阻率的贡献。结果表明,在300 K下的存储导致联合电阻率的单调增加,主要是由于CuIn2的生长,而在77 K下的存储抑制了这种变化。此外,在未使用乙醇清洗处理的样品中,观察到电阻率在300 K时出现显著增加,这与腐蚀相关机制一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Applied Superconductivity
IEEE Transactions on Applied Superconductivity 工程技术-工程:电子与电气
CiteScore
3.50
自引率
33.30%
发文量
650
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Applied Superconductivity (TAS) contains articles on the applications of superconductivity and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Large scale applications include magnets for power applications such as motors and generators, for magnetic resonance, for accelerators, and cable applications such as power transmission.
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