Multi-Parameter Wavelength Characterization of Array Spectrometers Under Near-Limit Sampling Conditions.

IF 2.2 3区 化学 Q2 INSTRUMENTS & INSTRUMENTATION
Du Bo, Liu Liying, Wu Dongli, Wu Zhifeng, Zheng Feng, Liu Cong, Li Ning, Zhang Jing, Zhang Shihao
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引用次数: 0

Abstract

Accurate wavelength characterization is essential for high-precision spectral measurements, particularly in applications such as solar-induced chlorophyll fluorescence (SIF) retrieval, where weak spectral signals are highly sensitive to instrument performance. In array spectrometers, characteristic wavelengths can be defined by peak, center, or centroid positions, whereas spectral resolution is commonly represented by full width at half-maximum (FWHM) or equivalent rectangular width (ERW). This study systematically investigates the influence of sampling conditions on wavelength characterization using a crossed Czerny-Turner array spectrometer operating over the 650-800 nm spectral range. The concept of sampling ratio is employed to define near-limit sampling conditions, in which monochromatic spectral peaks are represented by only 2-5 detector pixels. Experimental results show that the spectrometer predominantly operates within this regime. Under these conditions, significant discrepancies arise among different characteristic wavelength definitions owing to the combined effects of discrete sampling and spectral peak shape. Peak-based wavelength estimation is primarily affected by local sampling variations, whereas centroid-based definitions are more sensitive to energy distribution and peak asymmetry. Furthermore, a systematic divergence between ERW and FWHM demonstrates that spectral resolution metrics depend not only on geometric peak width but also on spectral energy distribution, particularly under non-ideal imaging conditions. These results show that wavelength characterization should be regarded as a coupled problem involving sampling conditions, spectral peak representation, and resolution metrics rather than as independent parameters. The proposed multi-parameter characterization approach establishes a practical framework by clarifying the relationships among sampling ratio, characteristic wavelength definitions, and spectral resolution, introducing two deviation metrics to quantify inconsistencies among wavelength definitions, and revealing the complementary physical significance of FWHM and ERW from geometric and energy-distribution perspectives. This approach provides a physically interpretable basis for wavelength calibration, spectral resolution evaluation, and performance assessment of array spectrometers operating under near-limit sampling conditions.

近极限采样条件下阵列光谱仪的多参数波长表征。
准确的波长表征对于高精度光谱测量至关重要,特别是在太阳诱导叶绿素荧光(SIF)检索等应用中,弱光谱信号对仪器性能高度敏感。在阵列光谱仪中,特征波长可以通过峰、中心或质心位置来定义,而光谱分辨率通常由半最大值全宽度(FWHM)或等效矩形宽度(ERW)来表示。本研究系统地研究了采样条件对波长表征的影响,使用在650-800 nm光谱范围内工作的交叉切尔尼-特纳阵列光谱仪。采用采样比的概念来定义近极限采样条件,其中单色光谱峰仅由2-5个检测器像素表示。实验结果表明,谱仪主要工作在这一范围内。在这种情况下,由于离散采样和光谱峰形的综合影响,不同的特征波长定义之间存在显著差异。基于峰的波长估计主要受局部采样变化的影响,而基于质心的定义对能量分布和峰的不对称性更为敏感。此外,ERW和FWHM之间的系统差异表明,光谱分辨率指标不仅取决于几何峰宽,还取决于光谱能量分布,特别是在非理想成像条件下。这些结果表明,波长表征应被视为涉及采样条件、光谱峰表示和分辨率指标的耦合问题,而不是作为独立的参数。本文提出的多参数表征方法明确了采样比、特征波长定义和光谱分辨率之间的关系,引入了两个偏差指标来量化波长定义之间的不一致性,并从几何和能量分布的角度揭示了FWHM和ERW的互补物理意义,从而建立了一个实用框架。该方法为近极限采样条件下阵列光谱仪的波长校准、光谱分辨率评估和性能评估提供了物理可解释的基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Applied Spectroscopy
Applied Spectroscopy 工程技术-光谱学
CiteScore
6.60
自引率
5.70%
发文量
139
审稿时长
3.5 months
期刊介绍: Applied Spectroscopy is one of the world''s leading spectroscopy journals, publishing high-quality peer-reviewed articles, both fundamental and applied, covering all aspects of spectroscopy. Established in 1951, the journal is owned by the Society for Applied Spectroscopy and is published monthly. The journal is dedicated to fulfilling the mission of the Society to “…advance and disseminate knowledge and information concerning the art and science of spectroscopy and other allied sciences.”
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