Sandra Riaño, Jose-Domingo Santos, Miguel Esteras, Amaia Abanda, Javier Del Ser
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引用次数: 0
Abstract
In this work, we present a machine learning (ML) approach that integrates physics-based knowledge with data-driven techniques to estimate the open-circuit voltage (
) of photovoltaic (PV) systems. This self-supervised approach allows the detection of anomalies in operating systems, enabling the identification of potential faults and degradation related to
without requiring labelled data. Deviations in
values are detected by analysing the measurements recorded in the supervisory control and data acquisition (SCADA) system. This analysis is performed by a combination of clustering and regression algorithms. The proposed approach is validated on three different PV installations, showcasing its ability to detect variations in open-circuit voltage and to predict performance degradation. The proposed method achieves an
-squared (r2) value larger than 0.9 when trained on experimental
data from three distinct PV systems. Moreover, it estimates
from SCADA data with an average error below 5% compared with
–
curve measurements. The results of this study demonstrate that physics informed ML techniques can significantly enhance the performance and reliability of PV systems, enabling early fault detection and degradation forecasting.
期刊介绍:
Progress in Photovoltaics offers a prestigious forum for reporting advances in this rapidly developing technology, aiming to reach all interested professionals, researchers and energy policy-makers.
The key criterion is that all papers submitted should report substantial “progress” in photovoltaics.
Papers are encouraged that report substantial “progress” such as gains in independently certified solar cell efficiency, eligible for a new entry in the journal''s widely referenced Solar Cell Efficiency Tables.
Examples of papers that will not be considered for publication are those that report development in materials without relation to data on cell performance, routine analysis, characterisation or modelling of cells or processing sequences, routine reports of system performance, improvements in electronic hardware design, or country programs, although invited papers may occasionally be solicited in these areas to capture accumulated “progress”.