A Fast Convergence Background Calibration Technique for Gain Nonlinearity in Pipeline ADCs

IF 3.2 2区 工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Qiao Wang;Xizhu Peng;Zhifei Lu;Yutao Peng;He Tang
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引用次数: 0

Abstract

A novel background calibration technique for gain nonlinearity in pipeline analog-to-digital converters (ADCs) with fast convergence is presented in this brief. The proposed method leverages dual-comparator parallel calibration (DCPC) and multiplying digital-to-analog converter (MDAC) dither injection to extract inter-stage gain error (IGE), gain nonlinearity, and capacitor mismatch. This method employs a large dither window and a low-complexity algorithm to achieve fast convergence. Compared with prior dither-based calibration works, this work avoids introducing additional residue signal swing increment, thereby relaxing the design requirements of the residue amplifier (RA). Simulations demonstrate that the calibration technique improves the signal-to-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR) by 30.5 and 36.6 dB, respectively, in a 14-bit 1-Gsps pipeline ADC affected by IGE, gain nonlinearity, capacitor mismatch, and −74 dB thermal noise. The convergence requires only $1.25{\,}\times{\,}10^{6}$ conversions, representing an at least eightfold improvement over prior art.
管道adc增益非线性的快速收敛背景校正技术
提出了一种新的快速收敛流水线模数转换器(adc)增益非线性背景校正技术。该方法利用双比较器并行校准(DCPC)和乘法数模转换器(MDAC)抖动注入来提取级间增益误差(IGE)、增益非线性和电容失配。该方法采用大抖动窗口和低复杂度算法实现快速收敛。与先前基于抖动的校准方法相比,该方法避免了引入额外的剩余信号摆幅增量,从而降低了剩余放大器(RA)的设计要求。仿真结果表明,在受IGE、增益非线性、电容失配和- 74 dB热噪声影响的14位1-Gsps管道ADC中,该校准技术可将信噪比(SNDR)和无杂散动态范围(SFDR)分别提高30.5和36.6 dB。这种收敛只需要$1.25{\,}×{\,}10^{6}$转换,比现有技术至少提高了8倍。
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来源期刊
CiteScore
6.40
自引率
7.10%
发文量
187
审稿时长
3.6 months
期刊介绍: The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.
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