Mapping and Tracking Conductivity in Memristive Nanowire Networks With Electrical Resistance Tomography

Abstract

In recent years, electrical resistance tomography (ERT) has been successfully applied to map the conductivity of thin-film materials and graphene. Beyond the mapping of static conductivity distribution, ERT is proposed as a new valuable tool for the characterization of memristive materials that present a dynamic behavior, where the conductivity evolves over time depending on the external stimulation. In this work, we show that ERT can provide insight into both the conductivity distribution and its time evolution in memristive metallic nanowire (NW) networks, enabling visualization of induced conductive traces in samples potentiated by means of the ERT setup itself.