Dual-Polarized Tapered Slot Antenna for Measurement Probe in Multi-Probe Measurement

Abstract

This paper proposes a dual-polarized tapered slot antenna probe for multi-probe near-field over-the-air (OTA) measurements. An elliptical stub is adopted to shorten the offset in a cross-shaped configuration, enabling dual-polarization measurements at the same spatial point without introducing fabrication complexity and performance degradation. The probe integrates measurement circuits for direct voltage-based electric-field detection. Simulation and experimental results confirm low mutual coupling and stable dual-polarized characteristics, demonstrating suitability for efficient near-field OTA testing.