Cryo-FIB–enabled 3D imaging of biological specimens

Q3 Immunology and Microbiology
Seonhye Son, Sujin Lee, Jihyun Kim, Chihong Song
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引用次数: 0

Abstract

Cryo-electron tomography (cryo-ET) has become a key technique for observing the three-dimensional structures of biomolecular complexes and organelles in cellular and tissue environments in situ. However, for thicker specimens that cannot be directly imaged at an electron-transparent thickness, the practical success of cryo-ET depends largely on workflow design that reproducibly yields high-quality, target-containing lamellae. Cryo-FIB-SEM is the de facto standard platform for precisely machining frozen specimens to an electron-transparent thickness, and it integrates the overall process into a single system, encompassing targeting via cryo-CLEM, the management of major failure modes such as contamination, charging, curtaining, and downstream steps for data reconstruction and interpretation. This review summarizes a cryo-FIB-SEM–centered cryo-ET workflow from the perspectives of specimen preparation, targeting, milling, acquisition, reconstruction, and interpretation. In addition, we discuss extended preparation and imaging strategies for thicker specimens, including high-pressure freezing (HPF), the waffle method, cryo-FIB-SEM slice-and-view imaging, and Serial Lift-Out, highlighting both their expanding capabilities and the operational challenges that remain for robust and scalable implementation.

冷冻fib -启用生物标本的三维成像。
低温电子断层扫描(cryo-ET)已成为在细胞和组织环境中原位观察生物分子复合物和细胞器三维结构的关键技术。然而,对于不能在电子透明厚度上直接成像的较厚标本,cryo-ET的实际成功在很大程度上取决于工作流程的设计,该设计可重复性地产生高质量的含有目标的薄片。Cryo-FIB-SEM是精确加工冷冻标本到电子透明厚度的事实上的标准平台,它将整个过程集成到一个系统中,包括通过cryo-CLEM靶向,主要故障模式的管理,如污染,充电,窗帘,以及数据重建和解释的下游步骤。本文综述了以cryo- fib - sem为中心的cryo-ET工作流程,从标本制备、靶向、铣削、采集、重建和解释等方面进行了总结。此外,我们还讨论了较厚标本的扩展制备和成像策略,包括高压冷冻(HPF)、华夫饼法、冷冻fib - sem切片成像和串行Lift-Out,强调了它们的扩展能力和操作挑战,这些挑战仍然是稳健和可扩展的实施。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
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