Mitigating EMI Susceptibility in Three OpAmp INA With a High CMRR EMI Immune OTA

IF 2.6 3区计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2026-08-01 Epub Date: 2026-04-13 DOI:10.1109/TEMC.2026.3677893

Shivdeep;Sahil Sharma;Mahendra Sakare;Devarshi Mrinal Das

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引用次数: 0

Abstract

Operational transconductance amplifiers (OTAs) are susceptible to conducted electromagnetic interference (EMI) reaching their input terminals. A DC OOV is generated, and it shifts the biasing of the circuit, which may cause an erroneous output or saturation in the worst case. The three-OpAmp instrumentation amplifier (INA) is widely used in analog front-end circuits for sensor interfacing, where the common-mode rejection ratio (CMRR) is an important performance specification. This article investigates the EMI-susceptibility of the three-OpAmp INA and presents an EMI-immune two-stage OTA with Miller compensation design to minimize the EMI-induced offset voltage in the three-OpAmp INA. The CMRR and in-band offset of the INA are taken into consideration along with EMI immunity. High CMRR of

$>$

81 dB and low in-band offset voltage of

$< $

298

$\mu$

V of the EMI-immune INA is measured on the IC fabricated using UMC 180 nm CMOS technology.

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利用高CMRR电磁干扰免疫OTA降低三OpAmp INA的电磁干扰敏感性

操作跨导放大器（OTAs）容易受到传导电磁干扰（EMI）到达其输入端。产生直流OOV，它移位电路的偏置，在最坏的情况下可能导致错误输出或饱和。三opamp仪表放大器（INA）广泛应用于传感器接口的模拟前端电路中，其中共模抑制比（CMRR）是一项重要的性能指标。本文研究了三运放INA的emi敏感性，并提出了一种具有Miller补偿设计的emi免疫两级OTA，以最小化三运放INA中的emi诱导失调电压。同时考虑了中频带的CMRR和带内偏移以及电磁干扰抗扰度。在采用UMC 180 nm CMOS技术制造的集成电路上，测量了emi免疫INA的高CMRR为81 dB，低带内失调电压为298 $ $\mu$V。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Electromagnetic Compatibility 工程技术-电信学

CiteScore

4.80

自引率

19.00%

发文量

235

审稿时长

2.3 months

期刊介绍： IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.