Mapping of the Physical and Mechanical Properties of End-Cut Pine Wood by the Scratch Test Method for the Problems of Dendrochronology and Dendroclimatology
A. A. Samodurov, A. I. Tyurin, V. V. Korenkov, M. A. Yunak, V. V. Rodaev, A. O. Zhigachev, G. V. Grigoriev, V. A. Tyurin
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Abstract
The results of mapping the mechanical properties, in particular, microhardness HS(r, φ), of the entire surface of end cuts of Scots pine (Pinus sylvestris L.) wood using the scratch test method, followed by use of the data for dendrochronology and dendroclimatology, are presented. A multiple increase in HS (from 50 to 250 MPa) within an annual ring (AR) is revealed during the transition from early wood (EW) to late wood (LW). From the scratch-test curves, the width of the AR in various radial directions is determined and EW and LW are identified. A correlation analysis of the AR parameters with climate data is carried out. Time intervals are identified in which temperature or precipitation have the greatest positive or negative impact on the AR parameters.
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Nanobiotechnology Reports publishes interdisciplinary research articles on fundamental aspects of the structure and properties of nanoscale objects and nanomaterials, polymeric and bioorganic molecules, and supramolecular and biohybrid complexes, as well as articles that discuss technologies for their preparation and processing, and practical implementation of products, devices, and nature-like systems based on them. The journal publishes original articles and reviews that meet the highest scientific quality standards in the following areas of science and technology studies: self-organizing structures and nanoassemblies; nanostructures, including nanotubes; functional and structural nanomaterials; polymeric, bioorganic, and hybrid nanomaterials; devices and products based on nanomaterials and nanotechnology; nanobiology and genetics, and omics technologies; nanobiomedicine and nanopharmaceutics; nanoelectronics and neuromorphic computing systems; neurocognitive systems and technologies; nanophotonics; natural science methods in a study of cultural heritage items; metrology, standardization, and monitoring in nanotechnology.
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