Transient current sharing in parallel GaN FETs: The role of parasitic capacitances

Power electronic devices and components Pub Date : 2026-03-01 Epub Date: 2026-02-24 DOI:10.1016/j.pedc.2026.100138
Salvatore Musumeci PhD , Vincenzo Barba PhD , Michele Pastorelli Professor , Marco Palma MSc
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Abstract

This paper examines the impact of parasitic capacitances on the dynamic current sharing behaviour of Gallium Nitride (GaN) field-effect transistors (FETs) operating in parallel configurations. As GaN technology continues to gain prominence in high-performance power electronic systems, paralleling multiple devices has become a common strategy to increase current-handling capability. However, non-idealities such as parasitic elements introduce significant challenges in achieving balanced current distribution during switching transients. To examine these effects, a custom-designed experimental platform was developed, enabling independent gate control and current measurement for each GaN FET via dedicated source shunt resistors. The test setup facilitates the precise characterisation of transient behavior and allows for detailed analysis under controlled conditions. Complementary simulation studies were conducted to support the experimental results and to identify key parameters influencing transient current mismatch. The paper highlights the critical role of parasitic capacitances—both device-internal and layout-induced—in shaping the peak transient current distribution among parallel devices during turn-on events. A methodology is proposed to estimate the maximum allowable parasitic capacitance that ensures the peak pulse current remains within the safe operating limits specified by device manufacturers. This insight is essential for the robust design of multi-device GaN switching assemblies, where overcurrent during transients can compromise long-term reliability or lead to failure. The outcomes of this research provide practical design guidelines for optimising parallel GaN switch configurations, with particular attention to parasitic management, driver strategy, and layout considerations. These contributions support the development of reliable and high-efficiency GaN-based power modules for advanced power conversion applications.

Abstract Image

并联GaN场效应管的暂态电流分担:寄生电容的作用
本文研究了寄生电容对并联工作的氮化镓场效应晶体管(fet)动态电流共享行为的影响。随着GaN技术在高性能电力电子系统中的应用日益突出,并联多器件已成为提高电流处理能力的常用策略。然而,非理想情况,如寄生元件,在开关瞬态期间实现平衡电流分布带来了重大挑战。为了检查这些影响,开发了一个定制设计的实验平台,通过专用源分流电阻对每个GaN场效应管进行独立的栅极控制和电流测量。测试装置有助于精确表征瞬态行为,并允许在受控条件下进行详细分析。为了支持实验结果,确定影响暂态电流失配的关键参数,进行了补充仿真研究。本文强调了器件内部和布局诱导的寄生电容在形成并联器件之间的峰值瞬态电流分布中的关键作用。提出了一种方法来估计最大允许寄生电容,以确保峰值脉冲电流保持在设备制造商规定的安全操作范围内。这种见解对于多器件GaN开关组件的稳健设计至关重要,因为瞬态过电流可能会损害长期可靠性或导致故障。本研究的结果为优化并行GaN开关配置提供了实用的设计指南,特别注意寄生管理,驱动策略和布局考虑。这些贡献支持开发可靠和高效的基于gan的功率模块,用于先进的功率转换应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Power electronic devices and components
Power electronic devices and components Hardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality
CiteScore
2.00
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0.00%
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80 days
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