Dispersion-interference coupled infrared static Fourier transform spectrometer

IF 3.4 3区 物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION
Infrared Physics & Technology Pub Date : 2026-05-01 Epub Date: 2026-02-14 DOI:10.1016/j.infrared.2026.106461
Yudong Liu , Baixuan Zhao , Yupeng Chen , Xudong Du , Luyang Wang , Kaifeng Zheng , Yingze Zhao , Haitao Nie , Yuxin Qin , Meiru Zheng , Weibiao Wang , Jingqiu Liang , Jinguang Lv
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引用次数: 0

Abstract

In this work, we propose a dispersion-interference coupled infrared static Fourier transform spectrometer (DICIS-FTS). By innovatively integrating a dual-blazed-grating dispersion compensation system with a static Fourier transform spectrometer based on a stepped micro-mirror array, the proposed system synchronously acquires two-dimensional interferograms featuring coupled spectral dispersion and narrowband interference without mechanical scanning, thereby enabling broadband, high-resolution spectral measurement in the mid-wave infrared region. A scalar-diffraction-theory-based model is established to quantitatively describe the dispersion-interference coupling mechanism. Using this model, the influence of key parameters in both the dispersion-compensation module and the static FTS on spectral resolution, optical field distribution, and diffraction efficiency is systematically investigated through numerical simulation. Furthermore, an experimental DICIS-FTS system is implemented, demonstrating a spectral resolution measurement error of less than 15%. Measurements of a standard bandpass filter and an acetonitrile sample yield a center-wavenumber peak-positioning error ≤ 0.5 cm⁻1.
色散-干涉耦合红外静态傅立叶变换光谱仪
在这项工作中,我们提出了一个色散-干涉耦合红外静态傅立叶变换光谱仪(DICIS-FTS)。该系统创新地将双燃烧光栅色散补偿系统与基于阶跃微镜阵列的静态傅立叶变换光谱仪集成在一起,无需机械扫描即可同步获取具有光谱色散耦合和窄带干扰的二维干涉图,从而实现中波红外区域的宽带、高分辨率光谱测量。建立了基于标量衍射理论的模型,定量描述了色散-干涉耦合机理。利用该模型,通过数值模拟系统地研究了色散补偿模块和静态FTS中关键参数对光谱分辨率、光场分布和衍射效率的影响。实验结果表明,DICIS-FTS系统的光谱分辨率测量误差小于15%。标准带通滤波器和乙腈样品的测量产生的中心波数峰定位误差≤0.5 cm毒毒图。
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来源期刊
CiteScore
5.70
自引率
12.10%
发文量
400
审稿时长
67 days
期刊介绍: The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region. Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine. Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.
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