Impedance Based Fixture Neutralization (FINE) Method to Replicate Field Environments in Laboratory Settings

Abstract

Test article vibration test responses will vary from one test laboratory to another due to differences in shaker and fixture dynamic characteristics. This is also seen between the field and laboratory due to the differing dynamic characteristics between field assembly loading and boundary conditions compared to the laboratory configuration. This work introduces a technique called Impedance Fixture Neutralization which customizes input forces to cause consistent responses for the Device Under Test across different vibration testing conditions. The customized force neutralizes the dynamic variations between configurations for the Device Under Test. The device responses can be replicated in several situations: when using a different fixture with the same attachment points, when the test article mounting location on the fixture changes, when the force location changes, or any combination of these situations. Impedance Fixture Neutralization uses the uncoupled dynamic characteristics of the test article and excitation fixtures to customize the input thereby causing the same test article responses between two mounting configurations (either field to laboratory or two different laboratory configurations). The application of the technique is shown using an analytical model of a two-beam system and analytically using experimental FRFs from plate and frame component hardware characterization tests. In both cases a device under test is attached to two test fixtures wherein the dynamic differences in the configurations are neutralized.