Automatic Nanoparticles Counting for TEM Images by Combination of Distance Transform, Watershed Segmentation and U-Net Machine Learning

IF 2.1 3区 工程技术 Q2 ANATOMY & MORPHOLOGY
Microscopy Research and Technique Pub Date : 2026-06-01 Epub Date: 2026-02-23 DOI:10.1002/jemt.70131
W. A. A. L. Wanniarachchi, W. A. M. Madhavi
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引用次数: 0

Abstract

Accurate counting of nanoparticles in microscopy images such as SEM and TEM is critical for advancing materials science and nanotechnology. Though many conventional as well as novel methods exist to count particles in microscopy images, the presence of overlapping particles poses significant challenges. This study introduces a novel computational approach to count nanoparticles in microscopy images, addressing limitations in handling particle overlap. The proposed method integrates distance transform, watershed segmentation, and U-Net machine learning. Distance transform enhances finding center points of the particles; watershed segmentation effectively separates overlapping particles; and U-Net enables robust particle segmentation from complex image backgrounds. The methodology was first developed using computer-generated grayscale images with varying particle sizes and overlap percentages, then validated on a dataset of 17 TEM images (1022 × 668 pixels) of Fe3O4 and silica-coated Fe3O4 nanoparticles at 20 nm and 50 nm scales. Conventional convolution-based methods could accurately count non-overlapping particles but failed to give the accurate count when particles were overlapped. The accuracy of convolution-based methods also depended on kernel radius selection. Replacing convolution method with the distance transform and watershed method significantly improved the accuracy of particle counting in images with overlapping particles. The U-Net model, combined with a smooth blending algorithm, achieved a mean percentage error of 6.5% in particle counting on real TEM images. This approach demonstrates significant promise for applications in materials science, nanotechnology, and biology, where accurate particle quantification is essential. By addressing the limitations of conventional techniques, it offers a practical and efficient solution for automated nanoparticle analysis in microscopy images.

Abstract Image

结合距离变换、分水岭分割和U-Net机器学习的TEM图像纳米粒子自动计数。
在扫描电镜和透射电镜等显微图像中精确计数纳米粒子对于推进材料科学和纳米技术至关重要。尽管存在许多传统的以及新颖的方法来计数显微镜图像中的粒子,但重叠粒子的存在提出了重大的挑战。本研究引入了一种新的计算方法来计数显微镜图像中的纳米粒子,解决了处理粒子重叠的限制。该方法集成了距离变换、分水岭分割和U-Net机器学习。距离变换增强了寻找粒子中心点的能力;分水岭分割能有效分离重叠粒子;U-Net可以从复杂的图像背景中实现鲁棒的粒子分割。该方法首先使用计算机生成的具有不同粒径和重叠百分比的灰度图像来开发,然后在20 nm和50 nm尺度上对17张Fe3O4和二氧化硅涂层Fe3O4纳米颗粒的TEM图像(1022 × 668像素)进行验证。传统的基于卷积的方法可以准确地计数不重叠的粒子,但当粒子重叠时不能给出准确的计数。基于卷积的方法的精度也依赖于核半径的选择。用距离变换和分水岭法代替卷积法,显著提高了粒子重叠图像中粒子计数的精度。结合光滑混合算法,U-Net模型在真实TEM图像上的粒子计数平均百分比误差为6.5%。这种方法在材料科学、纳米技术和生物学等领域的应用前景十分广阔,在这些领域,精确的粒子量化是必不可少的。通过解决传统技术的局限性,它为显微镜图像中的自动纳米颗粒分析提供了一个实用而有效的解决方案。
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来源期刊
Microscopy Research and Technique
Microscopy Research and Technique 医学-解剖学与形态学
CiteScore
5.30
自引率
20.00%
发文量
233
审稿时长
4.7 months
期刊介绍: Microscopy Research and Technique (MRT) publishes articles on all aspects of advanced microscopy original architecture and methodologies with applications in the biological, clinical, chemical, and materials sciences. Original basic and applied research as well as technical papers dealing with the various subsets of microscopy are encouraged. MRT is the right form for those developing new microscopy methods or using the microscope to answer key questions in basic and applied research.
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