Nanoporosity imaging by positronium lifetime tomography

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION
K. Dulski , E. Beyene , N. Chug , C. Curceanu , E. Czerwiński , M. Das , M. Gorgol , B. Jasińska , K. Kacprzak , Ł. Kapłon , G. Korcyl , T. Kozik , K. Kubat , D. Kumar , E. Lisowski , F. Lisowski , J. Mędrala-Sowa , S. Niedźwiecki , P. Pandey , S. Parzych , P. Moskal
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引用次数: 0

Abstract

Positron Annihilation Lifetime Spectroscopy (PALS) is a well-established non-destructive technique used for nanostructural characterization of porous materials. It is based on the annihilation of a positron and an electron. Mean positron lifetime in the material depends on the free voids size and molecular environment, allowing the study of porosity and structural transitions in the nanometer scale. We have developed a novel method enabling spatially resolved PALS, thus providing tomography of nanostructural characterization of an extended object. Correlating space (position) and structural (lifetime) information brings new insight in materials studies, especially in the characterization of the purity and pore distribution. For the first time, a porosity image using stationary positron sources for the simultaneous measurement of the porous polymers XAD4, silica aerogel powder IC3100, and polyvinyl toluene scintillator PVT by the J-PET (Jagiellonian Positron Emission Tomography) system is demonstrated.
正电子寿命层析成像的纳米孔隙成像
正电子湮灭寿命光谱(PALS)是一种成熟的非破坏性技术,用于表征多孔材料的纳米结构。它是基于一个正电子和一个电子的湮灭。材料中的平均正电子寿命取决于自由空隙的大小和分子环境,从而可以在纳米尺度上研究孔隙度和结构转变。我们开发了一种新的方法,可以实现空间分辨PALS,从而提供扩展物体的纳米结构表征的断层扫描。空间(位置)和结构(寿命)信息的关联为材料研究带来了新的见解,特别是在纯度和孔隙分布的表征方面。本文首次利用J-PET(雅盖隆正电子发射断层成像)系统,利用固定正电子源同时测量多孔聚合物XAD4、硅胶气凝胶粉末IC3100和聚氯乙烯闪烁体PVT的孔隙率图像。
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来源期刊
CiteScore
3.20
自引率
21.40%
发文量
787
审稿时长
1 months
期刊介绍: Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section. Theoretical as well as experimental papers are accepted.
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