{"title":"Assessing the Probability of Detection in a Frequency-Selective EMD Detector: A Design Perspective","authors":"Xinting Xue;Tim Claeys;Davy Pissoort","doi":"10.1109/TEMC.2026.3659559","DOIUrl":null,"url":null,"abstract":"Electronic devices exposed to complex electromagnetic environments can fail at specific frequencies. Early, frequency-selective detection of such “weak spots” is therefore desirable, whereas time-domain field probes provide only broadband indications and may over-trigger. This article presents a frequency-selective detector based on software-defined radio with field-programmable gate array acceleration, which transforms time-domain samples into spectra with reduced latency. The study focuses on narrowband burst electromagnetic disturbances and develops closed-form expressions for the probability of detection as a function of front-end bandwidth, frequency span, dwell time, hopping time, frequency resolution, and disturbance duration. The analysis is corroborated by Monte Carlo simulation and conducted measurements across 70 MHz–6 GHz. Results reveal how design choices and hardware latencies bound the attainable detection probability and delineate the hopping-limited regime. This article concludes with practical boundary conditions and design guidelines to maximize detection performance under resource constraints, offering a configurable alternative where high-end real-time analysers are impractical.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"68 3","pages":"544-556"},"PeriodicalIF":2.6000,"publicationDate":"2026-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11393521/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/2/11 0:00:00","PubModel":"Epub","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Electronic devices exposed to complex electromagnetic environments can fail at specific frequencies. Early, frequency-selective detection of such “weak spots” is therefore desirable, whereas time-domain field probes provide only broadband indications and may over-trigger. This article presents a frequency-selective detector based on software-defined radio with field-programmable gate array acceleration, which transforms time-domain samples into spectra with reduced latency. The study focuses on narrowband burst electromagnetic disturbances and develops closed-form expressions for the probability of detection as a function of front-end bandwidth, frequency span, dwell time, hopping time, frequency resolution, and disturbance duration. The analysis is corroborated by Monte Carlo simulation and conducted measurements across 70 MHz–6 GHz. Results reveal how design choices and hardware latencies bound the attainable detection probability and delineate the hopping-limited regime. This article concludes with practical boundary conditions and design guidelines to maximize detection performance under resource constraints, offering a configurable alternative where high-end real-time analysers are impractical.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.