Kaiyuan Zhou;Wenlong Yang;Xuejie Xie;Hengan Zhou;Cheng Zhuo;Enlong Liu
{"title":"Asymmetric Write Error Rate Caused by Self-Heating-Induced Offset Field Shift in Spin-Orbit-Torque Magnetic Tunnel Junctions","authors":"Kaiyuan Zhou;Wenlong Yang;Xuejie Xie;Hengan Zhou;Cheng Zhuo;Enlong Liu","doi":"10.1109/LMAG.2026.3652528","DOIUrl":null,"url":null,"abstract":"In this letter, we study the asymmetric increase of write error rate (WER) as the write voltage is elevated in spin-orbit-torque (SOT) magnetic tunnel junctions (MTJs) with perpendicular magnetic anisotropy. Besides the decrease of the free layer’s (FL) coercive field rendering the FL more vulnerable to the influence of offset field from synthetic antiferromagnets (SAFs), we observe, that during the write process, the temperature rise caused by the self-heating effect also modifies the magnetic properties of SAF layers in MTJ stacks. Through the measurement and analysis of two device types with different SAF designs, the amplitude and direction of the offset field show different temperature dependence, which determines an opposite preferentially stable state for the FL, and hence the anomalously high WER. Macrospin simulations of WER incorporating self-heating effect and temperature-dependent magnetic properties in both FL and SAF reproduce well the experimental observations. These findings offer novel insights into the role of the offset field and its temperature dependence in optimizing WER performance in SOT-MTJ devices.","PeriodicalId":13040,"journal":{"name":"IEEE Magnetics Letters","volume":"17 ","pages":"1-5"},"PeriodicalIF":1.1000,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Magnetics Letters","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/11344730/","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this letter, we study the asymmetric increase of write error rate (WER) as the write voltage is elevated in spin-orbit-torque (SOT) magnetic tunnel junctions (MTJs) with perpendicular magnetic anisotropy. Besides the decrease of the free layer’s (FL) coercive field rendering the FL more vulnerable to the influence of offset field from synthetic antiferromagnets (SAFs), we observe, that during the write process, the temperature rise caused by the self-heating effect also modifies the magnetic properties of SAF layers in MTJ stacks. Through the measurement and analysis of two device types with different SAF designs, the amplitude and direction of the offset field show different temperature dependence, which determines an opposite preferentially stable state for the FL, and hence the anomalously high WER. Macrospin simulations of WER incorporating self-heating effect and temperature-dependent magnetic properties in both FL and SAF reproduce well the experimental observations. These findings offer novel insights into the role of the offset field and its temperature dependence in optimizing WER performance in SOT-MTJ devices.
期刊介绍:
IEEE Magnetics Letters is a peer-reviewed, archival journal covering the physics and engineering of magnetism, magnetic materials, applied magnetics, design and application of magnetic devices, bio-magnetics, magneto-electronics, and spin electronics. IEEE Magnetics Letters publishes short, scholarly articles of substantial current interest.
IEEE Magnetics Letters is a hybrid Open Access (OA) journal. For a fee, authors have the option making their articles freely available to all, including non-subscribers. OA articles are identified as Open Access.