X–ray diffraction in different crystal cuts under a temperature gradient

Abstract

The peculiarities of X–ray diffraction from atomic planes of the same family in different cuts of quartz single crystals under the temperature gradient are investigated. Quartz single crystals were shaped into rectangular parallelepiped plates with X- and Z-cuts, with one heated edge oriented parallel to the (10 $\bar{1}$ 0) reflecting planes. The experiments were carried out using collimated polychromatic X–rays in symmetric Laue geometry. For different values of the temperature gradient applied to the crystal, both sectional topograms at different distances from the crystal and spectra of the reflected beam were obtained. The experimental results showed that the parameters of the deformation field formed at the same temperature gradient applied perpendicularly to the reflecting planes (10 $\bar{1}$ 0) of the crystal with different cuts are significantly different: for the same heat applied to the single crystal, the bending radius in the X–cut sample was significantly smaller than the bending radius of the Z–cut sample.