{"title":"FSMformer: An efficient direction-aware graph transformer for state register detection of gate-level netlist","authors":"Zongtai Li, Liang Yang, Hao Li, Mian Lou, Zeyu Yang, Weidong Xu","doi":"10.1016/j.vlsi.2026.102656","DOIUrl":null,"url":null,"abstract":"<div><div>Although the use of third-party netlist IP can enhance the quality of integrated circuit products and reduce development cycles, it also introduces potential security vulnerabilities. Identifying state registers in sequential netlists is a commonly adopted technique to assist engineers in understanding the control logic of unknown gate-level netlists. Traditional graph theory-based detection methods, such as RELIC and FSMX-ultra, suffer from low accuracy and high computational complexity. Recent graph neural network-based detection methods, such as ReIGNN, also exhibit limited accuracy, with many data DFFs being misclassified as state DFFs. In this article, we propose a graph transformer-based method, FSMformer, which utilizes bidirectional message passing as the local module and direction-aware linear fast attention as the global module, to enable the simultaneous extraction of structural and functional features from sequential netlists, thereby achieving efficient and accurate detection of state DFFs in large-scale netlists. According to the experimental results, our proposed FSMformer outperforms not only the state-of-the-art graph theory-based method FSMX-ultra and the state-of-the-art GNN-based method ReIGNN, but also various advanced neural network baselines that we employed for state DFFs detection.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"108 ","pages":"Article 102656"},"PeriodicalIF":2.6000,"publicationDate":"2026-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926026000118","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/1/7 0:00:00","PubModel":"Epub","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Although the use of third-party netlist IP can enhance the quality of integrated circuit products and reduce development cycles, it also introduces potential security vulnerabilities. Identifying state registers in sequential netlists is a commonly adopted technique to assist engineers in understanding the control logic of unknown gate-level netlists. Traditional graph theory-based detection methods, such as RELIC and FSMX-ultra, suffer from low accuracy and high computational complexity. Recent graph neural network-based detection methods, such as ReIGNN, also exhibit limited accuracy, with many data DFFs being misclassified as state DFFs. In this article, we propose a graph transformer-based method, FSMformer, which utilizes bidirectional message passing as the local module and direction-aware linear fast attention as the global module, to enable the simultaneous extraction of structural and functional features from sequential netlists, thereby achieving efficient and accurate detection of state DFFs in large-scale netlists. According to the experimental results, our proposed FSMformer outperforms not only the state-of-the-art graph theory-based method FSMX-ultra and the state-of-the-art GNN-based method ReIGNN, but also various advanced neural network baselines that we employed for state DFFs detection.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.