Position Calibration and Pixel Correction for Uneven Brightness Micro LED Display

IF 1.8 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Shih-Chang Hsia, Szu-Hong Wang, Ning-Hsiang Yang
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引用次数: 0

Abstract

Due to process deviations (Devs) in Micro LEDs, the luminous efficiency of each individual Micro LED can differ. Consequently, this leads to uneven luminance across the Micro LED matrix panel. In this study, a correction algorithm is proposed with the aim of improving luminance inhomogeneity on the panel. The brightness value of each pixel point on the LED panel is measured using a camera. Since the panel’s position may shift during detection, our approach incorporates self-detection and position correction to handle such misalignments. This eliminates the need for manually aligning the LED module to a fixed position on mechanical fixtures in our calibration system. The embedded system uses a camera to detect panel brightness and then generates correction coefficients for individual LED. Afterward, the coefficients are loaded into the FPGA control board and stored in memory as a Look-Up Table (LUT). Pixel correction on the Micro LED panel is achieved by selecting the corresponding coefficient from the LUT for each pixel position. The same procedures are iteratively performed ~3–4 times, using recursive processing to achieve superior uniformity across the Micro LED panel.

Abstract Image

Abstract Image

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Abstract Image

亮度不均匀微型LED显示屏的位置标定与像素校正
由于微型LED的工艺偏差(Devs),每个微型LED的发光效率可能不同。因此,这会导致微LED矩阵面板上的亮度不均匀。在本研究中,提出了一种校正算法,旨在改善面板上的亮度不均匀性。LED面板上每个像素点的亮度值是用摄像头测量的。由于面板的位置可能会在检测过程中发生变化,我们的方法结合了自我检测和位置校正来处理这种错位。这消除了在我们的校准系统中手动将LED模块对准机械夹具上的固定位置的需要。嵌入式系统使用摄像头来检测面板亮度,然后为单个LED生成校正系数。之后,系数被加载到FPGA控制板中,并作为查找表(LUT)存储在内存中。Micro LED面板上的像素校正是通过从LUT中选择每个像素位置的相应系数来实现的。相同的程序迭代执行~ 3-4次,使用递归处理来实现Micro LED面板上的优越均匀性。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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