Differential roles of DNA double strand break repair pathways in response to X-ray, proton, and alpha-particle irradiation.

IF 2.4
Gerarda van de Kamp, Tim Heemskerk, Marta Rovituso, Roland Kanaar, Jeroen Essers
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Abstract

Purpose: High linear energy transfer (LET) radiation is more harmful than low LET radiation because it deposits energy in a concentrated manner, resulting in clustered DNA damage (CDD). Double strand breaks (DSBs) are among the most damaging types of DNA damage, and if not repaired, they may trigger cell death. DSBs can be repaired through three mechanisms: non-homologous end joining (NHEJ), homologous recombination (HR), and theta-mediated end joining (TMEJ). This study aimed to assess how these pathways contribute to repairing DSBs induced by low LET X-ray and proton radiation, and high LET alpha-particle radiation.

Materials and methods: We used mouse embryonic stem (mES) cells lacking key repair proteins to examine clonogenic survival and the formation and resolution of 53BP1 foci, a DNA damage marker, after exposure to X-ray, proton, and alpha-particle radiation.

Results and conclusions: The results showed increased sensitivity to X-ray and proton radiation in NHEJ, HR, and TMEJ repair-deficient cell lines compared to wild-type cells, with similar trends for both radiation types. Notably, Rad54-deficient cells showed slower resolution of 53BP1 foci after proton exposure, indicating increased reliance on HR for repairing proton-induced DSBs. Clonogenic survival assays revealed a relative biological effectiveness (RBE) of 4.6-5.8 for alpha-particles compared to protons and X-rays, confirming that alpha-particles are more effective at causing cell death. Our findings suggest that TMEJ is important for repairing DSBs caused by alpha-particles. This study highlights differences in repairing low LET versus high LET DNA damage, offering new insights for radiation biology and therapeutic strategies.

DNA双链断裂修复途径在响应x射线、质子和α粒子辐照中的不同作用。
目的:高线性能量转移(LET)辐射比低线性能量转移(LET)辐射更有害,因为它以集中的方式沉积能量,导致聚集性DNA损伤(CDD)。双链断裂(DSBs)是最具破坏性的DNA损伤类型之一,如果不修复,它们可能会引发细胞死亡。dsb可通过三种机制修复:非同源末端连接(NHEJ)、同源重组(HR)和β介导的末端连接(TMEJ)。本研究旨在评估这些途径如何有助于修复低LET x射线和质子辐射以及高LET α粒子辐射诱导的dsb。材料和方法:我们使用缺乏关键修复蛋白的小鼠胚胎干(mES)细胞,检测x射线、质子和α粒子辐射暴露后的克隆存活和DNA损伤标志物53BP1灶的形成和分辨率。结果和结论:结果显示,与野生型细胞相比,NHEJ、HR和TMEJ修复缺陷细胞系对x射线和质子辐射的敏感性增加,两种辐射类型的趋势相似。值得注意的是,rad54缺陷细胞在质子暴露后显示53BP1病灶的分辨率较慢,表明修复质子诱导的dsb增加了对HR的依赖。克隆生存试验显示,与质子和x射线相比,α粒子的相对生物有效性(RBE)为4.6-5.8,证实α粒子在导致细胞死亡方面更有效。我们的研究结果表明,TMEJ对修复α粒子引起的dsb很重要。本研究强调了低LET与高LET DNA损伤修复的差异,为放射生物学和治疗策略提供了新的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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