Influence of atomic coordination environment on the elastic-delocalization-induced artifacts in atomic-resolution elemental mapping

IF 2.7 3区 工程技术 Q1 MICROSCOPY
Micron Pub Date : 2026-02-01 Epub Date: 2025-10-31 DOI:10.1016/j.micron.2025.103946
Peng Tang , Guang Liu , Jianjun Li , Zhixin Zeng , Xuewen Li , Yu Zhuo , Weibin Cui , Xiaoxiao Fu
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引用次数: 0

Abstract

Elastic electron delocalization displaces elemental signals from their true atomic positions, introducing artifacts in atomic-resolution elemental maps acquired via atomic-resolution energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS), which may potentially lead to misinterpretation of new structure. This study systematically investigates the influence of the atomic coordination environment on delocalization distance using a model structure of multi-element metal carbide Mo1.33Er0.67Nb2AlC3. Building on experimentally observed artifacts, model simulations reveal that EELS signals are more localized for light elements, while EDS signals are more localized for heavy elements. Furthermore, while the delocalization distance follows an increasing trend with larger convergence semi-angles and greater sample thicknesses, the atomic number of neighboring atoms has a negligible effect—typically resulting in deviations of less than 0.1 Å, which is negligible for current structural interpretation. In contrast, variations in interatomic spacing lead to non-monotonic changes in delocalization distance, with overall fluctuations remaining within 20 %, even as spacing nearly doubles. These insights offer a quantitative basis for identifying and interpreting imaging artifacts, contributing to more accurate atomic-scale structural analysis using EELS and EDS.
原子配位环境对原子分辨率元素映射中弹性离域伪影的影响。
弹性电子离域使元素信号偏离其真实的原子位置,在通过原子分辨率能量色散x射线能谱(EDS)和电子能量损失能谱(EELS)获得的原子分辨率元素图中引入伪影,这可能会导致对新结构的误解。本研究采用多元素金属碳化物Mo1.33Er0.67Nb2AlC3模型结构,系统地研究了原子配位环境对离域距离的影响。基于实验观察到的伪像,模型模拟表明EELS信号对轻元素更局部化,而EDS信号对重元素更局部化。此外,虽然离域距离随着收敛半角的增大和样品厚度的增大而增大,但邻近原子的原子序数的影响可以忽略不计——通常导致偏差小于0.1 Å,这对于当前的结构解释来说是可以忽略不计的。相反,原子间间距的变化导致离域距离的非单调变化,即使间距几乎翻倍,总体波动仍保持在20% %以内。这些见解为识别和解释成像伪影提供了定量基础,有助于使用EELS和EDS进行更准确的原子尺度结构分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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