Peng Tang , Guang Liu , Jianjun Li , Zhixin Zeng , Xuewen Li , Yu Zhuo , Weibin Cui , Xiaoxiao Fu
{"title":"Influence of atomic coordination environment on the elastic-delocalization-induced artifacts in atomic-resolution elemental mapping","authors":"Peng Tang , Guang Liu , Jianjun Li , Zhixin Zeng , Xuewen Li , Yu Zhuo , Weibin Cui , Xiaoxiao Fu","doi":"10.1016/j.micron.2025.103946","DOIUrl":null,"url":null,"abstract":"<div><div>Elastic electron delocalization displaces elemental signals from their true atomic positions, introducing artifacts in atomic-resolution elemental maps acquired via atomic-resolution energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS), which may potentially lead to misinterpretation of new structure. This study systematically investigates the influence of the atomic coordination environment on delocalization distance using a model structure of multi-element metal carbide Mo<sub>1.33</sub>Er<sub>0.67</sub>Nb<sub>2</sub>AlC<sub>3</sub>. Building on experimentally observed artifacts, model simulations reveal that EELS signals are more localized for light elements, while EDS signals are more localized for heavy elements. Furthermore, while the delocalization distance follows an increasing trend with larger convergence semi-angles and greater sample thicknesses, the atomic number of neighboring atoms has a negligible effect—typically resulting in deviations of less than 0.1 Å, which is negligible for current structural interpretation. In contrast, variations in interatomic spacing lead to non-monotonic changes in delocalization distance, with overall fluctuations remaining within 20 %, even as spacing nearly doubles. These insights offer a quantitative basis for identifying and interpreting imaging artifacts, contributing to more accurate atomic-scale structural analysis using EELS and EDS.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"201 ","pages":"Article 103946"},"PeriodicalIF":2.7000,"publicationDate":"2026-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432825001647","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/10/31 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0
Abstract
Elastic electron delocalization displaces elemental signals from their true atomic positions, introducing artifacts in atomic-resolution elemental maps acquired via atomic-resolution energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS), which may potentially lead to misinterpretation of new structure. This study systematically investigates the influence of the atomic coordination environment on delocalization distance using a model structure of multi-element metal carbide Mo1.33Er0.67Nb2AlC3. Building on experimentally observed artifacts, model simulations reveal that EELS signals are more localized for light elements, while EDS signals are more localized for heavy elements. Furthermore, while the delocalization distance follows an increasing trend with larger convergence semi-angles and greater sample thicknesses, the atomic number of neighboring atoms has a negligible effect—typically resulting in deviations of less than 0.1 Å, which is negligible for current structural interpretation. In contrast, variations in interatomic spacing lead to non-monotonic changes in delocalization distance, with overall fluctuations remaining within 20 %, even as spacing nearly doubles. These insights offer a quantitative basis for identifying and interpreting imaging artifacts, contributing to more accurate atomic-scale structural analysis using EELS and EDS.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.