Sebastian Klötzer , Jim Honea , Nils Duchow , Georgii Iashin
{"title":"Gigahertz, low-cost current shunt with retrofitting capability for characterization of fast-switching GaN devices","authors":"Sebastian Klötzer , Jim Honea , Nils Duchow , Georgii Iashin","doi":"10.1016/j.pedc.2025.100124","DOIUrl":null,"url":null,"abstract":"<div><div>A low-cost current shunt based on a flexible polyimide printed circuit board (PCB) design is proposed in this article. With its low insertion inductance in the range of 300<!--> <!-->pH and bandwidth in excess of 1<!--> <!-->GHz, the design is well suited for characterization of very fast GaN devices. The thin layer-stack and bendability of the proposed sensor enables retrofitting into many existing designs that were not specifically prepared for current measurement. The ability to add and remove the sensors at different locations can significantly enhance investigations, e.g. when paralleling devices or during troubleshooting. Having the ability to retrofit a current sensor into low inductance commutation loops, even in fast GaN FET designs consisting solely of SMD devices, can be an alternative to designing specific PCBs just for switching characterization and can help to save time and resources in benchmarking.</div></div>","PeriodicalId":74483,"journal":{"name":"Power electronic devices and components","volume":"12 ","pages":"Article 100124"},"PeriodicalIF":0.0000,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Power electronic devices and components","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2772370425000495","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/10/18 0:00:00","PubModel":"Epub","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A low-cost current shunt based on a flexible polyimide printed circuit board (PCB) design is proposed in this article. With its low insertion inductance in the range of 300 pH and bandwidth in excess of 1 GHz, the design is well suited for characterization of very fast GaN devices. The thin layer-stack and bendability of the proposed sensor enables retrofitting into many existing designs that were not specifically prepared for current measurement. The ability to add and remove the sensors at different locations can significantly enhance investigations, e.g. when paralleling devices or during troubleshooting. Having the ability to retrofit a current sensor into low inductance commutation loops, even in fast GaN FET designs consisting solely of SMD devices, can be an alternative to designing specific PCBs just for switching characterization and can help to save time and resources in benchmarking.
Power electronic devices and componentsHardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality