Opportunities from energy-loss near-edge fine structure analysis to track chemical and structural damage in zircon

IF 2.7 3区 工程技术 Q1 MICROSCOPY
Micron Pub Date : 2026-01-01 Epub Date: 2025-10-10 DOI:10.1016/j.micron.2025.103928
M. Bugnet , P.-M. Zanetta , S. Sao Joao , A.-M. Seydoux-Guillaume , E. Balan , G.A. Botton , D. Cabaret , G. Radtke
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引用次数: 0

Abstract

Zircon (ZrSiO4) is the oldest-known mineral of Earth and an ubiquitous silicate in geochronology. More specifically, the accumulation of alpha decay damage in zircon over time significantly affects its physical and chemical properties, and can lead to a disturbance of the ages measured in this mineral. Therefore, analytical tools that enable comprehensive structural and chemical information at the nanoscale in this compound are highly sought after. In this context, we explore the electron energy-loss fine structures resulting from the excitation of O 1s and Si 2p core electrons in zircon, which are interpreted from ab initio calculations in a single-particle framework. An excellent agreement is obtained between the experimental and calculated fine structures, emphasizing the large distortion of the final electronic states induced by the core-hole potential. The O-K edge is particularly rich in information, with intense peaks dominated by O 2p - Zr 4d and O 2p - Si 3sp hybrids. This work suggests that the near-edge structures from the O 1s and Si 2p excitations accessible from electron energy-loss spectroscopy or X-ray absorption spectroscopy could be used as tools to follow, interpret and understand structural and chemical modifications in zircon subject to natural radiation damage. We illustrate the potential of this approach through the evolution of near-edge fine structures in a zircon sample that exhibits a locally amorphized zone formed by ultrafast laser excitation.
利用能量损失近边缘精细结构分析追踪锆石化学和结构损伤的机会。
锆石(ZrSiO4)是地球上已知最古老的矿物,也是地质年代学中普遍存在的硅酸盐。更具体地说,随着时间的推移,锆石中α衰变损伤的积累会显著影响其物理和化学性质,并可能导致这种矿物中测量的年龄受到干扰。因此,能够在纳米尺度上获得这种化合物的综合结构和化学信息的分析工具受到高度追捧。在此背景下,我们探索了锆石中由O1s和Si2p核心电子激发产生的电子能量损失精细结构,并在单粒子框架下用从头算方法解释了这些结构。实验结果与计算得到的精细结构非常吻合,强调了芯空穴势引起的最终电子态的大畸变。O-K边缘的信息尤其丰富,密集的峰主要是O2p - Zr4d和O2p - Si3sp杂化体。这项工作表明,通过电子能量损失光谱或x射线吸收光谱可以获得O1s和Si2p激发的近边结构,可以作为跟踪、解释和理解锆石在自然辐射损伤下的结构和化学修饰的工具。我们通过锆石样品中近边缘精细结构的演变来说明这种方法的潜力,该样品显示出由超快激光激发形成的局部非晶区。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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