On-board calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties

IF 3.6 2区物理与天体物理 Q2 PHYSICS, APPLIED

Applied Physics Letters Pub Date : 2025-10-13 DOI:10.1063/5.0299758

Akitomi Shirachi, Motoya Shinozaki, Yasuhide Tomioka, Hisashi Inoue, Kenta Itoh, Yusuke Kozuka, Takanobu Watanabe, Shoichi Sato, Takeshi Kumasaka, Tomohiro Otsuka

{"title":"On-board calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties","authors":"Akitomi Shirachi, Motoya Shinozaki, Yasuhide Tomioka, Hisashi Inoue, Kenta Itoh, Yusuke Kozuka, Takanobu Watanabe, Shoichi Sato, Takeshi Kumasaka, Tomohiro Otsuka","doi":"10.1063/5.0299758","DOIUrl":null,"url":null,"abstract":"Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-board calibration near the device remains an important challenge. In this study, we develop an on-board calibrated rf measurement system operating at 4 K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"135 1","pages":""},"PeriodicalIF":3.6000,"publicationDate":"2025-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0299758","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}

引用次数: 0

Abstract

Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-board calibration near the device remains an important challenge. In this study, we develop an on-board calibrated rf measurement system operating at 4 K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems.

查看原文本刊更多论文

在低温下测定srtio3基电容器性能的车载校准射频测量

利用半导体量子点作为量子比特的候选之一，量子计算已成为下一代信息处理的有前途的技术。射频（rf）反射计在量子点读出中起着重要的作用，但需要在低温下精确的射频测量技术。虽然低温校准技术是射频反射计必不可少的技术，但设备附近的机载校准仍然是一个重要的挑战。在这项研究中，我们开发了一个在4 K下工作的机载校准射频测量系统，用于表征基于srtio3的变容管，这是可调谐阻抗匹配电路的有前途的组件。我们的系统通过消除与长射频线路相关的误差来实现准确的测量。我们研究了SrTiO3晶体的退火条件、晶体取向和Ca掺杂对射频反射频率范围内变容特性的影响。我们的研究结果为优化这些组件在量子信息处理系统中的低温射频应用提供了见解。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Applied Physics Letters 物理-物理：应用

CiteScore

6.40

自引率

10.00%

发文量

1821

审稿时长

1.6 months

期刊介绍： Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.