{"title":"Optimization of spiro–OMeTAD as the buffer layer for CH3NH3PbI3 perovskite solar cells using SCAPS","authors":"Anteneh Yesigat , Chernet Amene Geffe , Newayemedhin Abera , Yunxiang Zhang , Qinfang Zhang","doi":"10.1016/j.jpcs.2025.113250","DOIUrl":null,"url":null,"abstract":"<div><div>Spiro-OMeTAD, a hole transport material (HTM), has garnered significant attention in perovskite solar cell (PSC) research for enhancing the efficiency and stability of methylammonium lead iodide (CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub>) devices. However, perovskite lead contains material that faces challenges such as thermal instability, lead toxicity, limited power conversion efficiency, and obstacles to the commercialization of PSC devices. In this work, we numerically optimized an inverted device structure (Spiro-OMeTAD/methylammonium lead iodide/PCBM/ZnO/ITO) using the solar cell simulation tool via Solar Cell Capacitance Simulator (SCAPS). Here, the Spiro-OMeTAD material functions as the hole transport layer, while the PCBM and zinc oxide (ZnO) form the electron transport bilayer, with the Indium tin oxide (ITO) serving as the transparent conductive electrode. By carefully adjusting the thickness of buffer layer, charge carrier concentration, and parasitic resistance at varying operating temperatures, we achieved an optimized device that offers an efficiency (<em>PCE</em>) of 22.57 %, an open circuit voltage (<em>V</em><sub>OC</sub>) of 1.0838 V, a fill factor (<em>FF</em>) of 82.72 %, and a short circuit current density (<em>J</em><sub>SC</sub>) of 25.174476 mA/cm<sup>2</sup>. These simulation results will assist in fabricating a perovskite device via Spiro-OMeTAD as the buffer layer to reduce the perovskite grain size. Metallic dopants promote the formation of oxidized radical cations. The buffer layer improves hole mobility, conductivity, and overall device stability by protecting against environmental degradation.</div></div>","PeriodicalId":16811,"journal":{"name":"Journal of Physics and Chemistry of Solids","volume":"209 ","pages":"Article 113250"},"PeriodicalIF":4.9000,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Physics and Chemistry of Solids","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0022369725007036","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Spiro-OMeTAD, a hole transport material (HTM), has garnered significant attention in perovskite solar cell (PSC) research for enhancing the efficiency and stability of methylammonium lead iodide (CH3NH3PbI3) devices. However, perovskite lead contains material that faces challenges such as thermal instability, lead toxicity, limited power conversion efficiency, and obstacles to the commercialization of PSC devices. In this work, we numerically optimized an inverted device structure (Spiro-OMeTAD/methylammonium lead iodide/PCBM/ZnO/ITO) using the solar cell simulation tool via Solar Cell Capacitance Simulator (SCAPS). Here, the Spiro-OMeTAD material functions as the hole transport layer, while the PCBM and zinc oxide (ZnO) form the electron transport bilayer, with the Indium tin oxide (ITO) serving as the transparent conductive electrode. By carefully adjusting the thickness of buffer layer, charge carrier concentration, and parasitic resistance at varying operating temperatures, we achieved an optimized device that offers an efficiency (PCE) of 22.57 %, an open circuit voltage (VOC) of 1.0838 V, a fill factor (FF) of 82.72 %, and a short circuit current density (JSC) of 25.174476 mA/cm2. These simulation results will assist in fabricating a perovskite device via Spiro-OMeTAD as the buffer layer to reduce the perovskite grain size. Metallic dopants promote the formation of oxidized radical cations. The buffer layer improves hole mobility, conductivity, and overall device stability by protecting against environmental degradation.
期刊介绍:
The Journal of Physics and Chemistry of Solids is a well-established international medium for publication of archival research in condensed matter and materials sciences. Areas of interest broadly include experimental and theoretical research on electronic, magnetic, spectroscopic and structural properties as well as the statistical mechanics and thermodynamics of materials. The focus is on gaining physical and chemical insight into the properties and potential applications of condensed matter systems.
Within the broad scope of the journal, beyond regular contributions, the editors have identified submissions in the following areas of physics and chemistry of solids to be of special current interest to the journal:
Low-dimensional systems
Exotic states of quantum electron matter including topological phases
Energy conversion and storage
Interfaces, nanoparticles and catalysts.