A study combining EBSD and x-ray synchrotron diffraction using generalized pole figures

IF 5.5 2区 材料科学 Q1 MATERIALS SCIENCE, CHARACTERIZATION & TESTING
Natalia S. De Vincentis , Jairo A. Muñoz , Emanuel Benatti , Hugo R.Z. Sandim , Martina C. Avalos , H.-G. Brokmeier , Raúl E. Bolmaro
{"title":"A study combining EBSD and x-ray synchrotron diffraction using generalized pole figures","authors":"Natalia S. De Vincentis ,&nbsp;Jairo A. Muñoz ,&nbsp;Emanuel Benatti ,&nbsp;Hugo R.Z. Sandim ,&nbsp;Martina C. Avalos ,&nbsp;H.-G. Brokmeier ,&nbsp;Raúl E. Bolmaro","doi":"10.1016/j.matchar.2025.115641","DOIUrl":null,"url":null,"abstract":"<div><div>The development of advanced materials with optimum structural and mechanical properties requires a detailed control of their microstructures, textures and crystalline defects. Different techniques can be used for the characterization of those microstructures and defects, but it is their combination that could result in an exhaustive understanding of the microstructural and orientational developments on these materials.</div><div>X-Ray Diffraction (XRD) can be employed to obtain a “global” characterization of microstructure and texture, since the presence of defects in the sample produces shift and broadening of diffraction peaks. Different models have been developed to quantify these defects, some of which require fitting the complete diffraction pattern while others just individual peaks. These techniques can be extended to texture measurements, often represented through pole figures (PFs), wherein diffraction patterns are obtained for different sample orientations. This allows the determination of defect density in function of orientations and their representation in Generalized Pole Figures (GPFs).</div><div>On the other hand, for a more “local” characterization, Electron Backscatter Diffraction (EBSD) has proven to be extremely useful for microstructural and orientational analysis, allowing to assess defect accumulation in individual grains and orientations.</div><div>In this work, a set of 32,205 duplex steel samples cold-rolled up to 79 % reduction (in steps of approximately 20 %) are studied, aiming to investigate the evolution of defect storage with deformation in different orientations and texture components. For this purpose, Laue diffraction patterns have been obtained for these samples in P07 beamline in Petra III station (DESY), from which PFs and GPFs were obtained. This information is complemented with EBSD results, where dislocation arrays and grain and subgrain structures for particular orientations are studied. This paper not only aims at describing the microstructural evolution of a cold rolled duplex steel with increasing deformation, providing both a local and a global characterization of this microstructure, but also at exploring the capabilities of the diffraction techniques used for this purpose. The combination of both techniques allowed for an exhaustive analysis of defect storage and microstructural orientations developed with increasing deformation.</div></div>","PeriodicalId":18727,"journal":{"name":"Materials Characterization","volume":"229 ","pages":"Article 115641"},"PeriodicalIF":5.5000,"publicationDate":"2025-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Characterization","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1044580325009301","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
引用次数: 0

Abstract

The development of advanced materials with optimum structural and mechanical properties requires a detailed control of their microstructures, textures and crystalline defects. Different techniques can be used for the characterization of those microstructures and defects, but it is their combination that could result in an exhaustive understanding of the microstructural and orientational developments on these materials.
X-Ray Diffraction (XRD) can be employed to obtain a “global” characterization of microstructure and texture, since the presence of defects in the sample produces shift and broadening of diffraction peaks. Different models have been developed to quantify these defects, some of which require fitting the complete diffraction pattern while others just individual peaks. These techniques can be extended to texture measurements, often represented through pole figures (PFs), wherein diffraction patterns are obtained for different sample orientations. This allows the determination of defect density in function of orientations and their representation in Generalized Pole Figures (GPFs).
On the other hand, for a more “local” characterization, Electron Backscatter Diffraction (EBSD) has proven to be extremely useful for microstructural and orientational analysis, allowing to assess defect accumulation in individual grains and orientations.
In this work, a set of 32,205 duplex steel samples cold-rolled up to 79 % reduction (in steps of approximately 20 %) are studied, aiming to investigate the evolution of defect storage with deformation in different orientations and texture components. For this purpose, Laue diffraction patterns have been obtained for these samples in P07 beamline in Petra III station (DESY), from which PFs and GPFs were obtained. This information is complemented with EBSD results, where dislocation arrays and grain and subgrain structures for particular orientations are studied. This paper not only aims at describing the microstructural evolution of a cold rolled duplex steel with increasing deformation, providing both a local and a global characterization of this microstructure, but also at exploring the capabilities of the diffraction techniques used for this purpose. The combination of both techniques allowed for an exhaustive analysis of defect storage and microstructural orientations developed with increasing deformation.
用广义极图研究EBSD与x射线同步加速器衍射的结合
开发具有最佳结构和机械性能的先进材料需要对其微结构、纹理和晶体缺陷进行详细控制。不同的技术可以用于表征这些微观结构和缺陷,但只有将它们结合起来,才能对这些材料的微观结构和取向发展有一个详尽的了解。x射线衍射(XRD)可以获得微观结构和织构的“全局”表征,因为样品中缺陷的存在会产生衍射峰的移位和展宽。人们开发了不同的模型来量化这些缺陷,其中一些模型需要拟合完整的衍射图,而另一些模型只需要拟合单个峰。这些技术可以扩展到纹理测量,通常通过极图(pf)来表示,其中衍射图可以获得不同样品取向的衍射图。这样就可以确定缺陷密度的方向函数及其在广义极图(GPFs)中的表示。另一方面,对于更“局部”的表征,电子反向散射衍射(EBSD)已被证明对微观结构和取向分析非常有用,可以评估单个晶粒和取向中的缺陷积累。在这项工作中,研究了一组32,205双相钢样品,冷轧后降低了79%(步骤约为20%),旨在研究缺陷储存随不同取向和织构成分变形的演变。为此,在Petra III站(DESY)的P07光束线上获得了这些样品的劳埃衍射图,并从中获得了PFs和GPFs。这些信息与EBSD结果相辅相成,其中研究了特定取向的位错阵列和晶粒和亚晶粒结构。本文不仅旨在描述冷轧双相钢随变形增加的微观组织演变,提供这种微观组织的局部和全局特征,而且还探讨了用于此目的的衍射技术的能力。两种技术的结合允许对缺陷存储和随着变形增加而发展的微观结构取向进行详尽的分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Materials Characterization
Materials Characterization 工程技术-材料科学:表征与测试
CiteScore
7.60
自引率
8.50%
发文量
746
审稿时长
36 days
期刊介绍: Materials Characterization features original articles and state-of-the-art reviews on theoretical and practical aspects of the structure and behaviour of materials. The Journal focuses on all characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.,) and analysis (especially microanalysis and surface analytical techniques). Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are essential facets of the Journal. The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include: Metals & Alloys Ceramics Nanomaterials Biomedical materials Optical materials Composites Natural Materials.
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