{"title":"Enabling High-Accuracy Neuromorphic Computing via Precise Synaptic Weight Tuning in HfOx-Based 3D Vertical Memristors","authors":"Nawoon Kim, Jihee Park, Hyesung Na, Sungjun Kim","doi":"10.1002/admt.202500651","DOIUrl":null,"url":null,"abstract":"<p>This study presents a multibit implementation strategy using a vertically stacked resistive random-access memory (VRRAM) that uses an HfO<i><sub>x</sub></i>-based switching layer. The proposed VRRAM device operates via filamentary switching; however, by selectively forming and removing portions of the filament, it effectively mitigates the inherent issues of dispersion and nonlinearity typically associated with filament-based mechanisms. Furthermore, using an incremental step pulse with verify algorithm (ISPVA) measurement method where the device is allowed to reach a predetermined current level before transitioning to the subsequent target further enhances both the linearity and reduces the dispersion of the filamentary memory cell. In addition, the device demonstrates outstanding performance on modified national institute of standards and technology (MNIST) and fashion MNIST datasets, achieving accuracies of 96.65% and 76.50%, respectively, thereby surpassing current state of the art hardware-based implementations. These results collectively advance the scalability and practical feasibility of next-generation neuromorphic computing systems.</p>","PeriodicalId":7292,"journal":{"name":"Advanced Materials Technologies","volume":"10 19","pages":""},"PeriodicalIF":6.4000,"publicationDate":"2025-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Materials Technologies","FirstCategoryId":"88","ListUrlMain":"https://advanced.onlinelibrary.wiley.com/doi/10.1002/admt.202500651","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
This study presents a multibit implementation strategy using a vertically stacked resistive random-access memory (VRRAM) that uses an HfOx-based switching layer. The proposed VRRAM device operates via filamentary switching; however, by selectively forming and removing portions of the filament, it effectively mitigates the inherent issues of dispersion and nonlinearity typically associated with filament-based mechanisms. Furthermore, using an incremental step pulse with verify algorithm (ISPVA) measurement method where the device is allowed to reach a predetermined current level before transitioning to the subsequent target further enhances both the linearity and reduces the dispersion of the filamentary memory cell. In addition, the device demonstrates outstanding performance on modified national institute of standards and technology (MNIST) and fashion MNIST datasets, achieving accuracies of 96.65% and 76.50%, respectively, thereby surpassing current state of the art hardware-based implementations. These results collectively advance the scalability and practical feasibility of next-generation neuromorphic computing systems.
期刊介绍:
Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.