Deutsch Quantum Algorithm-Based Detection of Internal Fault in a Transformer

IF 2.5 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Surajit Chattopadhyay, Aditya Narayan Banerjee, Aritra Chattopadhyay, Santanu Chattopadhyay, Goutam Dalapati
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引用次数: 0

Abstract

This paper deals with a quantum algorithm for internal fault detection of a classical electrical system. Quantum computing is growing rapidly, offering many computational advantages along with enhanced security options. In this work, an attempt has been made to resolve a well-known classical problem using quantum computation. A classical system consisting of a multiphase transformer connected with power and load buses has been considered as a system. The objective has been set to detect whether any internal fault has occurred in the system. Though a classical solution exists using a differential protection scheme, here the same problem has been detected using a quantum algorithm. The result and analysis show that the system at healthy and fault conditions can be modeled using a quantum circuit, and together with a quantum algorithm, can be effectively applied to detect whether the fault has occurred internally to the system. Use of quantum computation-based fault discrimination involves less computational complexity. Moreover, the proposed quantum monitoring system can be used for fault detection that inherently offers secure transmission of fault information in quantum states.

基于Deutsch量子算法的变压器内部故障检测
研究了一种用于经典电气系统内部故障检测的量子算法。量子计算正在迅速发展,提供了许多计算优势以及增强的安全性选项。在这项工作中,我们尝试用量子计算来解决一个众所周知的经典问题。一个由多相变压器与电源和负载母线相连接组成的经典系统被视为一个系统。目标设置为检测系统是否存在内部故障。虽然存在使用差分保护方案的经典解决方案,但这里使用量子算法检测到相同的问题。结果和分析表明,可以利用量子电路对系统在健康状态和故障状态下进行建模,并结合量子算法有效地检测系统内部是否发生故障。使用基于量子计算的故障识别涉及较少的计算复杂度。此外,所提出的量子监控系统可用于故障检测,本质上提供了量子态故障信息的安全传输。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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