{"title":"Finite element buckling analysis for micro structures based on the couple stress theory","authors":"Yang Bae Jeon , Gi-Dong Sim , Jae-Hoon Choi","doi":"10.1016/j.tws.2025.114023","DOIUrl":null,"url":null,"abstract":"<div><div>Mechanical behavior at the micro- and nano-scale exhibits size-dependent effects, such as increased stiffness, which are not captured by classical continuum mechanics. These effects become particularly important in thin structures, where buckling is a critical failure mode; however, previous studies have been limited to simple geometries due to the complexity of the governing equations. This study develops a finite element framework for buckling analysis based on the modified couple stress theory (MCST), applicable to arbitrary geometries. Beam and shell elements are formulated to incorporate size effects, enabling buckling analysis of general structures. The framework is demonstrated on various configurations, including thin membranes under residual stress, stiffened plates, and tensile bars, highlighting its versatility. Numerical results show that accounting for size effects consistently increases the predicted critical buckling loads compared to classical continuum mechanics. The proposed approach offers a broadly applicable tool for stability assessment in micro-electromechanical systems (MEMS), flexible electronics, and thin-film micro sensors and actuators.</div></div>","PeriodicalId":49435,"journal":{"name":"Thin-Walled Structures","volume":"218 ","pages":"Article 114023"},"PeriodicalIF":6.6000,"publicationDate":"2025-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin-Walled Structures","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0263823125011127","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, CIVIL","Score":null,"Total":0}
引用次数: 0
Abstract
Mechanical behavior at the micro- and nano-scale exhibits size-dependent effects, such as increased stiffness, which are not captured by classical continuum mechanics. These effects become particularly important in thin structures, where buckling is a critical failure mode; however, previous studies have been limited to simple geometries due to the complexity of the governing equations. This study develops a finite element framework for buckling analysis based on the modified couple stress theory (MCST), applicable to arbitrary geometries. Beam and shell elements are formulated to incorporate size effects, enabling buckling analysis of general structures. The framework is demonstrated on various configurations, including thin membranes under residual stress, stiffened plates, and tensile bars, highlighting its versatility. Numerical results show that accounting for size effects consistently increases the predicted critical buckling loads compared to classical continuum mechanics. The proposed approach offers a broadly applicable tool for stability assessment in micro-electromechanical systems (MEMS), flexible electronics, and thin-film micro sensors and actuators.
期刊介绍:
Thin-walled structures comprises an important and growing proportion of engineering construction with areas of application becoming increasingly diverse, ranging from aircraft, bridges, ships and oil rigs to storage vessels, industrial buildings and warehouses.
Many factors, including cost and weight economy, new materials and processes and the growth of powerful methods of analysis have contributed to this growth, and led to the need for a journal which concentrates specifically on structures in which problems arise due to the thinness of the walls. This field includes cold– formed sections, plate and shell structures, reinforced plastics structures and aluminium structures, and is of importance in many branches of engineering.
The primary criterion for consideration of papers in Thin–Walled Structures is that they must be concerned with thin–walled structures or the basic problems inherent in thin–walled structures. Provided this criterion is satisfied no restriction is placed on the type of construction, material or field of application. Papers on theory, experiment, design, etc., are published and it is expected that many papers will contain aspects of all three.