Compact hybrid reluctance based tip/tilt actuator for large range fast steering mirrors

IF 3.7 2区 工程技术 Q2 ENGINEERING, MANUFACTURING
Alexander Pechhacker , Tobias Schopf , Ernst Csencsics , Georg Schitter
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引用次数: 0

Abstract

This work presents a compact tip/tilt fast steering mirror (FSM) based on a linearized hybrid reluctance actuation topology. The actuation principle is analyzed using a magnetic equivalent circuit model and finite-element method simulations. The proposed design achieves a large range of ±5/10 deg (mechanical/optical) with an optical aperture of 1 × 1.5 inch, delivering higher torque and linearity compared to the state of the art. To maintain compactness, the system uses magnetically coupled axes while achieving a decoupling of over 30 dB. Independent control loops for each yield position bandwidths of 1.06 kHz and 1.13 kHz, enabling a precision below 1.2 mdeg, and Lissajous scanning up to 110 Hz with 4 deg. Overall, the compact FSM demonstrates the highest range-bandwidth product (+22%) with the largest range of hybrid reluctance actuated systems.
用于大范围快速转向镜的紧凑混合磁阻式尖端/倾斜驱动器
本文提出了一种基于线性化混合磁阻驱动拓扑结构的紧凑尖端/倾斜快速转向镜(FSM)。利用磁等效电路模型和有限元仿真分析了其驱动原理。提出的设计实现了±5/10度(机械/光学)的大范围,光学孔径为1 × 1.5英寸,与目前的技术水平相比,提供更高的扭矩和线性度。为了保持紧凑性,该系统采用磁耦合轴,同时实现超过30 dB的去耦。每个产生位置带宽分别为1.06 kHz和1.13 kHz的独立控制回路,可实现1.2 m°以下的精度,Lissajous扫描4度时高达110 Hz。总体而言,紧凑的FSM具有最大范围的混合磁阻驱动系统,具有最高的范围带宽产品(+22%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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