Tuning the Microstructure and Thermoelectric Response of β-FeSi2 Thin Films via Cobalt Doping

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Shoug M. Alghamdi, Ayesha Hanif, Rasmiah S. Almufarij, Elsammani Ali Shokralla, M. D. Alshahrani, Islam Ragab, Mohamed Abdelsabour Fahmy, Abdulaziz M. Alanazi, Adnan Ali, Arslan Ashfaq
{"title":"Tuning the Microstructure and Thermoelectric Response of β-FeSi2 Thin Films via Cobalt Doping","authors":"Shoug M. Alghamdi,&nbsp;Ayesha Hanif,&nbsp;Rasmiah S. Almufarij,&nbsp;Elsammani Ali Shokralla,&nbsp;M. D. Alshahrani,&nbsp;Islam Ragab,&nbsp;Mohamed Abdelsabour Fahmy,&nbsp;Abdulaziz M. Alanazi,&nbsp;Adnan Ali,&nbsp;Arslan Ashfaq","doi":"10.1007/s10854-025-15897-3","DOIUrl":null,"url":null,"abstract":"<div><p>In this study, Co-doped β-FeSi<sub>2</sub> thin films were successfully synthesized using a simple thermal evaporation technique followed by post-annealing at 500 °C to explore their thermoelectric properties. The structural analysis confirmed the orthorhombic β-FeSi<sub>2</sub> phase with prominent diffraction peaks corresponding to the (220), (200), and (311) planes. The peak intensity increased with Co content up to x = 0.25, followed by a decline at x = 0.35, indicating improved crystallinity at moderate doping and structural disorder at higher concentrations. SEM images revealed a systematic microstructural evolution from nanoneedle-like morphology to granular agglomerates, consistent with XRD findings. Thermoelectric measurements showed that the Seebeck coefficient decreased with increasing the cobalt content due to higher carrier concentration, while electrical conductivity improved up to x = 0.25, owing to enhanced mobility and grain connectivity. The highest power factor of 11.39 µW/mK<sup>2</sup> at 550 K was achieved for the x = 0.25 sample, confirming the optimal doping level. This work highlights the significance of controlled cobalt doping in enhancing the thermoelectric performance of β-FeSi<sub>2</sub> thin films and provides insight into the interplay between microstructure and carrier transport.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 28","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-15897-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

In this study, Co-doped β-FeSi2 thin films were successfully synthesized using a simple thermal evaporation technique followed by post-annealing at 500 °C to explore their thermoelectric properties. The structural analysis confirmed the orthorhombic β-FeSi2 phase with prominent diffraction peaks corresponding to the (220), (200), and (311) planes. The peak intensity increased with Co content up to x = 0.25, followed by a decline at x = 0.35, indicating improved crystallinity at moderate doping and structural disorder at higher concentrations. SEM images revealed a systematic microstructural evolution from nanoneedle-like morphology to granular agglomerates, consistent with XRD findings. Thermoelectric measurements showed that the Seebeck coefficient decreased with increasing the cobalt content due to higher carrier concentration, while electrical conductivity improved up to x = 0.25, owing to enhanced mobility and grain connectivity. The highest power factor of 11.39 µW/mK2 at 550 K was achieved for the x = 0.25 sample, confirming the optimal doping level. This work highlights the significance of controlled cobalt doping in enhancing the thermoelectric performance of β-FeSi2 thin films and provides insight into the interplay between microstructure and carrier transport.

钴掺杂调节β-FeSi2薄膜的微观结构和热电响应
在本研究中,采用简单的热蒸发技术成功合成了共掺杂β-FeSi2薄膜,然后在500°C下进行后退火,以探索其热电性能。结构分析证实β-FeSi2为正交相,在(220)、(200)、(311)面有明显的衍射峰。当Co含量达到x = 0.25时,峰值强度增加,当Co含量达到x = 0.35时,峰值强度下降,表明在适度掺杂时结晶度提高,在较高浓度时结构无序。SEM图像显示了从纳米针状形貌到颗粒状团聚体的系统微观结构演变,与XRD结果一致。热电测量表明,由于载流子浓度的提高,塞贝克系数随着钴含量的增加而降低,而导电性提高到x = 0.25,这是由于迁移率和晶粒连通性的增强。在550 K时,x = 0.25样品的最高功率因数为11.39 μ W/mK2,证实了最佳掺杂水平。这项工作强调了控制钴掺杂对提高β-FeSi2薄膜热电性能的重要性,并提供了微观结构与载流子输运之间相互作用的见解。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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