Mohammad Shan, Khairi Faiz Muhammad, Mohd Ridha Muhammad, Yew Hoong Wong, Makoto Yoshida
{"title":"Advancements in copper and silver sintering as interconnect materials in electronics applications: review","authors":"Mohammad Shan, Khairi Faiz Muhammad, Mohd Ridha Muhammad, Yew Hoong Wong, Makoto Yoshida","doi":"10.1007/s10854-025-15835-3","DOIUrl":null,"url":null,"abstract":"<div><p>As technology advances toward electric vehicles (EVs), copper and silver are receiving growing attention due to their exceptional mechanical, electrical, and thermal properties. These materials withstand high temperatures and offer cost advantages over traditional solders. This review uniquely consolidates recent findings (2010–2024) on sintered Cu and Ag joints, emphasizing not only conventional sintering parameters such as particle shape, size, pressure, time, temperature, and environment, but also emerging aspects that have been overlooked in prior reviews. It offers an in-depth analysis of oxidation effects and prevention strategies, highlights how porosity and density impact mechanical reliability, and examines thermal characteristics such as conductivity, resistivity, and expansion. Unlike earlier surveys, this study critically assesses long-term reliability under thermal cycling, shock, and aging, and investigates mechanical reinforcement using carbon allotropes and metallic dopants. A distinguishing feature is the comparative evaluation of in-house versus commercial sinter pastes, focusing on their composition, organic additives, and fabrication routes. Overall, this work identifies evolving trends and future directions for high-performance interconnects in EVs and power electronics.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 28","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-15835-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
As technology advances toward electric vehicles (EVs), copper and silver are receiving growing attention due to their exceptional mechanical, electrical, and thermal properties. These materials withstand high temperatures and offer cost advantages over traditional solders. This review uniquely consolidates recent findings (2010–2024) on sintered Cu and Ag joints, emphasizing not only conventional sintering parameters such as particle shape, size, pressure, time, temperature, and environment, but also emerging aspects that have been overlooked in prior reviews. It offers an in-depth analysis of oxidation effects and prevention strategies, highlights how porosity and density impact mechanical reliability, and examines thermal characteristics such as conductivity, resistivity, and expansion. Unlike earlier surveys, this study critically assesses long-term reliability under thermal cycling, shock, and aging, and investigates mechanical reinforcement using carbon allotropes and metallic dopants. A distinguishing feature is the comparative evaluation of in-house versus commercial sinter pastes, focusing on their composition, organic additives, and fabrication routes. Overall, this work identifies evolving trends and future directions for high-performance interconnects in EVs and power electronics.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.