{"title":"Phase tuning and optoelectronic properties of solution-processed Ba-doped Sb2S3 chalcogenide thin films","authors":"Ali AK. Bakly, Xiang Li Zhong, Salih Abbas Habeeb","doi":"10.1007/s10854-025-15849-x","DOIUrl":null,"url":null,"abstract":"<div><p>Antimony ethyl xanthate (<b>1</b>) and barium isopropyl xanthate (<b>2</b>) were synthesised and used as single-source precursors (SSPs) to prepare solution-processed Ba-doped Sb<sub>2</sub>S<sub>3</sub> films. Ternary Sb<sub>2-x</sub>Ba<sub>x</sub>S<sub>3</sub> films (0 ≤ x ≤ 100) mol% Ba and (BaS) film were synthesised by spin-coating the solution on glass substrates and annealing at 550 °C for 1.5 h, and (Sb<sub>2</sub>S<sub>3</sub>) films were annealed at 250 °C for 1 h. Compositional, structural, morphological, optical, and electrical properties were characterised by p-XRD, EDX, ICP, Raman spectroscopy, SEM, TEM, and resistivity measurements (ρ). (p-XRD) reveals that the (Sb<sub>2</sub>S<sub>3</sub>) film has an orthorhombic structure with a dominant (210) orientation. Ba incorporation induced a progressive phase transition; the (103) orientation was promoted at intermediate doping, and it was modified into a cubic (111) BaS phase at higher doping levels. SEM shows lamellar morphology at 50 mol% Ba. The existence of Sb, Ba, and S was verified using (EDX) and (ICP), confirming intact decomposition and phase purity, consistent with the X-ray diffraction (XRD) and Raman results. The optical bandgap (E<sub>g</sub>), estimated from Tauc plots, ranged from 1.7 eV (Sb<sub>2</sub>S<sub>3</sub>) to 3.85 eV (BaS), indicating tunable optoelectronic properties. Resistivity increased with Ba content. (BaS) exhibited a raised resistivity (18.4 Ω cm), showing reduced conductivity compared to (Sb<sub>2</sub>S<sub>3</sub>).</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 27","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-15849-x","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Antimony ethyl xanthate (1) and barium isopropyl xanthate (2) were synthesised and used as single-source precursors (SSPs) to prepare solution-processed Ba-doped Sb2S3 films. Ternary Sb2-xBaxS3 films (0 ≤ x ≤ 100) mol% Ba and (BaS) film were synthesised by spin-coating the solution on glass substrates and annealing at 550 °C for 1.5 h, and (Sb2S3) films were annealed at 250 °C for 1 h. Compositional, structural, morphological, optical, and electrical properties were characterised by p-XRD, EDX, ICP, Raman spectroscopy, SEM, TEM, and resistivity measurements (ρ). (p-XRD) reveals that the (Sb2S3) film has an orthorhombic structure with a dominant (210) orientation. Ba incorporation induced a progressive phase transition; the (103) orientation was promoted at intermediate doping, and it was modified into a cubic (111) BaS phase at higher doping levels. SEM shows lamellar morphology at 50 mol% Ba. The existence of Sb, Ba, and S was verified using (EDX) and (ICP), confirming intact decomposition and phase purity, consistent with the X-ray diffraction (XRD) and Raman results. The optical bandgap (Eg), estimated from Tauc plots, ranged from 1.7 eV (Sb2S3) to 3.85 eV (BaS), indicating tunable optoelectronic properties. Resistivity increased with Ba content. (BaS) exhibited a raised resistivity (18.4 Ω cm), showing reduced conductivity compared to (Sb2S3).
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.