Fujun Wang , Jianhua Dai , Beichao Shi , Cunman Liang , Yanling Tian
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引用次数: 0
Abstract
To achieve smooth motion over a wide velocity range in micro-nano manufacturing, this paper presents a novel piezoelectric stick-slip actuator (PSSA) actuated by an orthogonally coupled symmetric mechanism (OCSM). The OCSM comprises two vertically symmetric branches, each branch containing a vertically series-connected III-shaped guiding and i-shaped passive flexible mechanism, enabling efficient transmission of the piezoelectric actuator (PZT) displacement to the driving foot while enhancing end stiffness and first-order natural frequency. The impact of the stiffness of each flexible mechanism on motion smoothness is investigated through theoretical analysis. Key parameters are determined, and finite element analysis is conducted for verification. A prototype of the PSSA has been manufactured, and experimental tests are conducted. The results indicate that the developed PSSA exhibits a compact structure, smooth motion under low driving voltage, high stepping mode resolution (38.5 nm), and rapid velocity (6.21 mm/s). The influence of driving voltage, driving frequency, and the number of pulse cycles per step on motion smoothness is analyzed. A macro-micro switching positioning experiment is conducted. And the scanning mode resolution is 20 nm. Tip-based nanofabrication (TBN) experiments are conducted to create micro-nano structures on silicon wafer surfaces.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.