{"title":"Dependence of the Charge State of Ions of a Periodic System of Elements on the Velocity of Charged Particles","authors":"N. N. Mikheev, I. Zh. Bezbakh","doi":"10.1134/S1027451025700260","DOIUrl":null,"url":null,"abstract":"<p>The results of solving the problem of describing the dependence of the charge state of the beam of ions on their velocity for all atoms of the periodic system of elements are presented. The values of the basic parameters that are necessary for calculating the charge state of the ion beam are determined and tested by comparing the calculations of the stopping power with an array of experimentally measured values<i>.</i></p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 1","pages":"167 - 172"},"PeriodicalIF":0.4000,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The results of solving the problem of describing the dependence of the charge state of the beam of ions on their velocity for all atoms of the periodic system of elements are presented. The values of the basic parameters that are necessary for calculating the charge state of the ion beam are determined and tested by comparing the calculations of the stopping power with an array of experimentally measured values.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.